SEMI PV57 - Test Method for Current-Voltage (I-V) Performance Measurement of Organic Photovoltaic (OPV) and Dye-Sensitized Solar Cell (DSSC)
This Standard was technically approved by the Photovoltaic Global Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on November 11, 2014. Available at www.semiviews.org and www.semi.org in December 2014.
This Standard proposes a performance test method for organic photovoltaic (OPV)/dye sensitized solar cell (DSSC) according to its current-voltage (I-V) measurement and device qualification.
The major difference between OPV/DSSC and p-n junction solar cells is photoelectric conversion mechanism, such as:
The operation principle of OPV/DSSC uses layers of organic molecules subject to lighting after excitation electronic, then passes to the inorganic/organic layer of the wide energy gap nano-layer and voltage.
OPV/DSSC has a different spectrum and absorption range with p-n junction than solar cell does.
OPV/DSSC needs more photoelectric conversion response time caused by specific material properties.
Therefore, OPV/DSSC shall need specific basis of reference to differ with standard test condition (STC) [AM 1.5G, 25°C, 1000 W.m–2] used by p-n junction solar cell, and also make corrections for spectral issue and reserves extra time for I-V test due to capacitance effect.
This Standard shall develop a performance test method for OPV/DSSC according to its I-V measurement and device qualification. The objective is to focus on OPV/DSSC I-V performance evaluation either indoors or outdoors, and provide some actions as below.
Define the specific STC (see ¶¶ 5.2.8 and 5.2.9) for OPV/DSSC when indoors.
Provide both statistic method (see §8) and testing procedures (see § 9) for OPV/DSSC to reduce measurement errors due to capacitive effect.
Evaluate the relationship (see Figure 4) between short-circuit current (Isc) and spectral correction factor (MMF).
Approach specific diffuse lighting application when indoors or outdoors.
Referenced SEMI Standards