SEMI A4 - Specification for the Automated Test Equipment Tester Event Messaging for Semiconductors (TEMS)
This Standard provides a vendor neutral way to collect test cell data and operating conditions. Ensuring compatibility between specific test systems and servers can become costly as semiconductor test systems use a diverse range of data formats, specifications, and interface requirements. This Standard is intended to reduce software development costs for ATE vendors, OSAT companies, IDM test operations, software providers, and handler equipment companies. It also addresses surging demand for real-time data analysis, real-time ATE input and control of the test flow to improve test yield, throughput, efficiency, and product quality.
Semiconductor test operations involving automated test equipment (ATE) today are experiencing increasing use of data for real-time data analysis and real-time ATE input and control, to improve test yield, throughput, efficiency, and product quality. At the same time, test equipment and test operations around the world use a diverse range of data formats, specifications, and interface requirements that create significant customer service and application engineering costs for ATE vendors, OSAT companies, IDM test operations, software providers, and handler equipment. The goal of this Specification is to create a vendor neutral way to collect test cell data.
This Specification covers test cell data and operating conditions collection.
This Specification indicates the minimum interface requirements along with methods for adding custom capabilities.
Referenced SEMI Standards (purchase separately)
SEMI A4-0421 (first published)
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