SEMI D47 - Test Method for Measurement of Bent Cold Cathode Flourescent Lamps
This standard was technically approved by the global Flat Panel Display Committee. This edition was approved for publication by the global Audits & Reviews Subcommittee on November 21, 2006. It was available at www.semi.org in February 2007.
The purpose of this document is to standardize the method for measurement of electrical and optical characteristics of bent cold cathode fluorescent lamp (CCFL).
Referenced SEMI Standards
SEMI D35 — Test Method for Measurement of Cold Cathode Fluorescent Lamp (CCFL) Characteristics
|Interested in purchasing additional SEMI Standards? Consider SEMIViews, an online portal with access to over 1000 Standards.|
Refund Policy: Due to the nature of our products, SEMI has a no refund/no exchange policy. Please make sure that you have reviewed your order prior to finalizing your purchase. All sales are final.