SEMI D64 - Test Method for Measuring the Spatial Contrast Ratio of Flat Panel Display

Volume(s): Flat Panel Display
Language: English
Type: Single Standards Download (.pdf)
Abstract

 

Contrast has a significant influence on the perceived image quality in display devices.</p><p>For several decades, physical contrast metrics such as contrast ratio (CR) and contrast modulation (CM) have been widely used to quantify the contrast performance of display devices.

 

A robust standardized test method for measuring the APL (average picture level) contrast ratios of flat panel display (FPD) systems is required to enable quality control in high volume manufacturing.

 

Existing international standards use full screen sequential test patterns that are not suitable for modern FPD systems that dynamically adjust gray levels based on image contents. International standards (IEC, ISO and VESA FPDM) define the contrast ratio (CR) and contrast modulation (CM).

 

Sequential full screen test pattern does not give constant results for the new display technologies that dynamically adjust gray levels based on image contents.

 

The test pattern where regions of various APL exist inside one image, therefore, is more reliable to assess the display device in terms of contrast ratio. APL values of various images, therefore, should be considered.

 

Consequently, this Test Method requires a pair of specified test patterns with APL variation, rather than sequential APL variation, used to evaluate the APL contrast ratio of a display device under test.

  

Referenced SEMI Standards

None.

Related Products
Interested in purchasing additional SEMI Standards?

Consider SEMIViews, an online portal with access to over 1000 Standards.

Refund Policy: Due to the nature of our products, SEMI has a no refund/no exchange policy. Please make sure that you have reviewed your order prior to finalizing your purchase. All sales are final.

Member Price: $113.00
Regular price Non-Member Price: $150.00