SEMI E33 - Guide for Semiconductor Manufacturing Equipment Electromagnetic Compatibility (EMC) -

Abstract

1  Purpose
1.1  The purpose of this Guide is make recommendations to help assure that manufacturing equipment used for manufacturing semiconductor devices will operate reliably without failures caused by electromagnetic interference (EMI). This desired characteristic is generally known as electromagnetic compatibility (EMC).
2  Scope
2.1  This Guide applies to equipment constructed for the purpose of manufacturing semiconductor devices. Equipment types include communications equipment, control equipment, processing equipment, metrology equipment, inspection equipment, automation equipment, and information technology equipment. Some terms are specialized to semiconductor facilities and equipment.
2.2  The primary focus of this Guide is semiconductor manufacturing equipment used for manufacturing semiconductor devices, but this Guide may also be applied to the equipment used for manufacturing related products (e.g., flat panel displays [FPDs], microelectromechanical systems [MEMS]).

Referenced SEMI Standards (purchase separately)
SEMI E78 — Guide to Assess and Control Electrostatic Discharge (ESD) and Electrostatic Attraction (ESA) for Equipment
SEMI F47 — Specification for Semiconductor Processing Equipment Voltage Sag Immunity

Revision History
SEMI E33-0824 (technical revision)
SEMI E33-0217E (editorial revision)
SEMI E33-0217 (technical revision)
SEMI E33-1012 (technical revision)
SEMI E33-94 (first published)

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