SEMI F61 - Guide to Design and Operation of a Semiconductor Ultrapure Water System -
Abstract
This Guide should be used in conjunction with SEMI F63 and
SEMI F75. Together these Guides provide recommendations for facility engineers
and other manufacturing professionals who are responsible for establishing
programs to monitor and control the quality of their ultrapure water (UPW)
systems through to point-of-use (POU).
This Guide describes the engineering and component
requirements for a UPW system used in semiconductor manufacturing. It is
intended to establish a common basis for developing detailed specifications for
design, operations, certification, and monitoring of UPW and hot ultrapure
water (HUPW) systems.
This Guide applies to advanced UPW systems used in
semiconductor manufacturing facilities for supplying high purity water for
wafer processing, chemical dilutions, and other facility applications. This
Guide provides definitions used for identification of UPW system components and
other commonly used terms associated with the semiconductor facility water
systems.
This Guide provides reference to other relevant SEMI Standards
that ensure quality and reliability of UPW systems. This Guide logically
follows the series of SEMI Standards developed for UPW; which includes SEMI
F63, a Standard defining the quality of UPW, and SEMI F75, a Standard for
monitoring UPW.
This Guide provides recommendations for design and
operation of the UPW system including treatment plant, distribution system, and
the semiconductor manufacturing tool hook up.
This Guide addresses the testing and prequalification of
high purity polymer materials used in UPW system equipment and distribution.
This Guide provides minimum definitions for site utilities
needed to support the UPW system.
This Standard provides guidance for construction,
qualification, and commissioning of new or recently upgraded UPW systems.
This Standard provides guidance on maintenance, operations,
safety, and redundancy of the UPW systems. This Guide provides further quality
information on critical components such as ion exchange resin and filter media.
Referenced SEMI Standards (purchase separately)
SEMI F19 — Specification for the Surface Condition of the
Wetted Surfaces of Stainless Steel Components
SEMI F57 — Specification for Polymer Materials and
Components Used in Ultrapure Water and Liquid Chemical Distribution Systems
SEMI F63 — Guide for Ultrapure Water System Used in
Semiconductor Processing
SEMI F75 — Guide for Quality Monitoring of Ultrapure Water
Used in Semiconductor Manufacturing
Revision History
SEMI F61-0521 (technical revision)
SEMI F61-0617 (complete rewrite)
SEMI F61-0301 (Reapproved 0309)
SEMI F61-0301 (first published)
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