SEMI FH5 - Guide for Reliability of Flexible Hybrid Electronics -

Abstract

1  Purpose
1.1  Flexible Hybrid Electronics (FHE) is a new technology. This Standard fulfills the need for an industry-wide accepted standard for testing that ensures the reliability of FHE-integrated systems. This Standard also addresses the need for reliability assurance and important variables that should be monitored during accelerated testing. Application-based reliability design rules enable fewer design iterations, reduce time to market, and shorten product ramp-up.
1.2  Consistency in the acquired data is presently limited. This Standard promotes the development of standardized data-collection protocols to promote mutual understanding and improve communications between designers, users, and suppliers of FHE-integrated systems, components, materials, and testing hardware. This Standard also enhances the robustness and capability of the design to improve the system’s design and manufacturing efficiency.
2  Scope
2.1  This Guide focuses on methods for reliability evaluation of FHE assemblies and systems, including but not limited to FHE-integrated systems consisting of substrates, inks, interconnect materials, encapsulants, and electronic components, to determine the reliability of the combined design and production process. Main topics include:
2.1.1  Qualification of New and Replacement Materials — Attributes and test methods to be considered in the identification and qualification of new and replacement materials.
2.1.2  Failure Modes and Mechanisms — Potential failure modes to be considered in the determination of reliability of the FHE integrated system. Identify the environments that accelerate the failure mechanisms and modes in an operational product in-service and post-assembly.
2.1.3  Accelerated Tests and Test-Levels — Considerations in the selection of accelerated tests, environmental conditions, durations, and pass-fail criteria for assurance of FHE reliability.
2.1.4  Modeling Methods for Life Prediction — Identify the modeling methods and guidance for specific use-case stresses and accelerated tests to ensure system reliability in the intended use application.
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Referenced SEMI Standards (purchase separately)
None
NOTICE: Unless otherwise indicated, all documents cited shall be the latest published versions.

Revision History
SEMI FH5-0526 (first published)

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