SEMI G23 - Test Method of Inductance for Internal Traces of Semiconductor Packages -

Abstract

This Test Method describes the measurement method for the inductance of internal traces of semiconductor packages.

This Test Method is applicable for the measurement of package inductance that is greater than 0.5 nH.

This Test Method describes the measurement of a pin grid array, one of the package types, as a sample.

This Test Method is also applicable to other types of packages.

The inductance in this Standard is limited to that of internal traces only and does not contain the portions contributed by the exposed areas such as pins and wires.

This Standard uses SI units.

Referenced SEMI Standards (purchase separately)

None.

Revision History

SEMI G23-0996 (Reapproved 0823)

SEMI G23-0996 (Reapproved 0318)

SEMI G23-0996 (Reapproved 0811)

SEMI G23-0996 (technical revision)

SEMI G23-89 (technical revision)

SEMI G23-84 (first published)

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