SEMI G52 - Test Method for Measurement of Ionic Contamination on Semiconductor Leadframes

Volume(s): Packaging
Language: English
Type: Single Standards Download (.pdf)
Abstract

This Standard was technically approved by the Assembly & Packaging Global Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on August 31, 2015. Available at www.semiviews.org and www.semi.org in November 2015; originally published in 1990; previously published November 2004.

 

This Standard describes the procedure to determine ionic contamination on leadframes using a water extraction method. The method is sensitive to Na+, NH4+, K+, Cl−, NO3-, Br−, SO42−, PO43−.

 

Referenced SEMI Standards

None.

Member Price: $113.00
Regular price Non-Member Price: $150.00