SEMI G52 - Test Method for Measurement of Ionic Contamination on Semiconductor Leadframes

Volume(s): Packaging
Language: English
Type: Single Standards Download (.pdf)

This Standard was technically approved by the Assembly & Packaging Global Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on August 31, 2015. Available at and in November 2015; originally published in 1990; previously published November 2004.


This Standard describes the procedure to determine ionic contamination on leadframes using a water extraction method. The method is sensitive to Na+, NH4+, K+, Cl−, NO3-, Br−, SO42−, PO43−.


Referenced SEMI Standards


Related Products
Interested in purchasing additional SEMI Standards?

Consider SEMIViews, an online portal with access to over 1000 Standards.

Refund Policy: Due to the nature of our products, SEMI has a no refund/no exchange policy. Please make sure that you have reviewed your order prior to finalizing your purchase. All sales are final.

Member Price: $113.00
Regular price Non-Member Price: $150.00