SEMI G52 - Test Method for Measurement of Ionic Contamination on Semiconductor Leadframes
This Standard was technically approved by the Assembly & Packaging Global Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on August 31, 2015. Available at www.semiviews.org and www.semi.org in November 2015; originally published in 1990; previously published November 2004.
This Standard describes the procedure to determine ionic contamination on leadframes using a water extraction method. The method is sensitive to Na+, NH4+, K+, Cl−, NO3-, Br−, SO42−, PO43−.
Referenced SEMI Standards