G05200 - SEMI G52 - Test Method for Measurement of Ionic Contamination on Semiconductor Leadframes

SEMI G52 - Test Method for Measurement of Ionic Contamination on Semiconductor Leadframes -

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Volume(s): Packaging
Language: English
Type: Single Standards Download (.pdf)
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Revision: SEMI G52-1120 - Current

Revision

Abstract

Contamination on leadframes can contribute to semiconductor device reliability problems. This Test Method may be used by lead frame manufacturers at outgoing inspection and by users at incoming inspection. Correlation of device reliability with contamination levels may lead to improved leadframe cleaning processes.


This Standard describes the procedure to determine ionic contamination on leadframes using a water extraction method. The method is sensitive to Na+, NH4+, K+, Cl−, NO3-, Br−, SO42−, PO43−.


Referenced SEMI Standards

None


Revision History

SEMI G52-1120 (technical revision)

SEMI G52-1115 (technical revision)

SEMI G52-90 (Reapproved 1104)

SEMI G52-90 (first published) 



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