SEMI G55 - Test Method for Measurement of Silver Plating Brightness
This Test Method is used to evaluate the silver plaiting quality on leadframe for process control and outgoing inspection at the supplier or by the user for incoming inspection for process control and outgoing inspection at the supplier or by the user for incoming inspection.
This Test Method describes the standard method for measuring the brightness of silver plating on semiconductor leadframes.
Referenced SEMI Standards
SEMI G21 — Specification for Plating Integrated Circuit Leadframes
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