G06000 - SEMI G60 - Test Method for the Measurement of Electrostatic Properties of Semiconductor Leadframe Interleafing Materials

SEMI G60 - Test Method for the Measurement of Electrostatic Properties of Semiconductor Leadframe Interleafing Materials -

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Volume(s): Packaging
Language: English
Type: Single Standards Download (.pdf)
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Revision: SEMI G60-94 (Reapproved 0318) - Inactive

Revision

Abstract

　

This Test Method describes a procedure to determine the electrostatic properties of interleaf materials in film or sheet form by measuring the magnitude and polarity of an induced charge and the time required for complete dissipation of the charge.

 

This Test Method is suitable for all interleaf materials and may be used by vendors at outgoing inspection, or customers at incoming inspection.

 

　

Referenced SEMI Standards

None.

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