SEMI G60 - Test Method for the Measurement of Electrostatic Properties of Semiconductor Leadframe Interleafing Materials
This Standard was technically approved by the Assembly & Packaging Global Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on August 18, 2017. Available at www.semiviews.org and www.semi.org in March 2018; originally published in 1994; previously published August 2011.
This Test Method describes a procedure to determine the electrostatic properties of interleaf materials in film or sheet form by measuring the magnitude and polarity of an induced charge and the time required for complete dissipation of the charge.
This Test Method is suitable for all interleaf materials and may be used by vendors at outgoing inspection, or customers at incoming inspection.
Referenced SEMI Standards