G08000 - SEMI G80 - Test Method for the Analysis of Overall Digital Timing Accuracy for Automated Test Equipment

Volume(s): Packaging
Language: English
Type: Single Standards Download (.pdf)

NOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to maintain Current Status have not been met. Inactive Standards or Safety Guidelines are available from SEMI and continue to be valid for use.


This procedure will define a standard process whereby any logic integrated circuit (IC) automatic test equipment (ATE) system can be evaluated for parameters that makeup an alternating current (AC) timing accuracy specification.


Application of this procedure will simplify ATE comparisons, reduce specification ambiguity, simplify user acceptance procedures, simplify ATE performance monitoring, and provide a common validation criteria for ATE suppliers.

This procedure is intended for analysis of timing accuracy specifications for all semiconductor ATE capable of digital functional testing. The extent of the analysis includes overall timing accuracy (OTA) and the primary components of overall timing accuracy as defined in the definition section of this Document.


Referenced SEMI Standards (purchase separately)

SEMI G79 –– Specification for Overall Digital Timing Accuracy


Revision History

SEMI G80-0200 (Reapproved 0612)

SEMI G80-0200 (first published)

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