SEMI G91 - Standard Test Data Format (STDF) Memory Fail Datalog -
NOTICE: This Standard or Safety Guideline has an Inactive
Status because the conditions to maintain Current Status have not been met.
Inactive Standards or Safety Guidelines are available from SEMI and continue to
be valid for use.
The purpose of this Standard is to provide a common format
for memory fail datalog specification along with necessary synchronization
information enabling an efficient dataflow for volume diagnostics applications
The purpose of this Standard is to provide a standard
format to log electrical failure information during test for embedded as well
as stand-alone memories. The Standard provides the definition of records and
their use for storing failure information.
The scope of the proposed Standard is the memory failure
information collected during electrical test for embedded as well as
stand-alone volatile memories.
Referenced SEMI Standards (purchase separately)
SEMI G91-0513 (first published)
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