SEMI G91 - Standard Test Data Format (STDF) Memory Fail Datalog
This Standard was technically approved by the Automated Test Equipment Global Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on December 24, 2011. Available at www.semiviews.org and www.semi.org in May 2013.
The purpose of this Standard is to provide a common format for memory fail datalog specification along with necessary synchronization information enabling an efficient dataflow for volume diagnostics applications for memories.
The purpose of this Standard is to provide a standard format to log electrical failure information during test for embedded as well as stand-alone memories. The Standard provides the definition of records and their use for storing failure information.
The scope of the proposed Standard is the memory failure information collected during electrical test for embedded as well as stand-alone volatile memories as shown Figure 1 below:
The scope of this Standard is as follows:
- Direct Access
- Single Die
- Stacked Dice
- Datalog format
- Definition of records and their use for storing failure information
- Data format for storing memory design information in the datalog
- Definition of format for enabling data integrity and consistency checking
- Reduction in data volume for storing a given amount of failure information
Referenced SEMI Standards
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