SEMI G91 - Standard Test Data Format (STDF) Memory Fail Datalog -

Member Price: $138.00
Non-Member Price: $180.00

Volume(s): Packaging
Language: English
Type: Single Standards Download (.pdf)
SEMI Standards Copyright Policy/License Agreements

Revision: SEMI G91-0513 - Inactive



NOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to maintain Current Status have not been met. Inactive Standards or Safety Guidelines are available from SEMI and continue to be valid for use.


The purpose of this Standard is to provide a common format for memory fail datalog specification along with necessary synchronization information enabling an efficient dataflow for volume diagnostics applications for memories.


The purpose of this Standard is to provide a standard format to log electrical failure information during test for embedded as well as stand-alone memories. The Standard provides the definition of records and their use for storing failure information.

The scope of the proposed Standard is the memory failure information collected during electrical test for embedded as well as stand-alone volatile memories.


Referenced SEMI Standards (purchase separately)



Revision History

SEMI G91-0513 (first published)

Interested in purchasing additional SEMI Standards?

Consider SEMIViews, an online portal with access to over 1000 Standards.

Refund Policy: Due to the nature of our products, SEMI has a no refund/no exchange policy. Please make sure that you have reviewed your order prior to finalizing your purchase. All sales are final.