Introduction to Yield US 11/06/2024

Introduction to Yield 

Dates & Times

November 6^th and 7^th

8:00 AM– 12:00 PM PST  

Location

Webinar 

Pricing

Members: $599

Non-Members: $649

Introduction to Yield is an 8-hour webinar that is held for 4 hours each day. It offers detailed instruction on a variety of effective tools, as well as the overall process flow for identifying, locating, and characterizing the defects responsible for the low yields. This course is designed for every manager, engineer, and technician working in the semiconductor field, using semiconductor components or supplying tools to the industry. 

Yield Analysis is an increasingly difficult and complex process. Today, engineers are required to locate defects on complex integrated circuits. In many ways, this is akin to locating a needle in a haystack, where the needles get smaller, and the haystack gets bigger every year. This is made even more complex by the tremendous amount of data produced by fab tools and test systems. Engineers are required to understand a variety of disciplines to effectively perform yield analysis. This requires knowledge of subjects like design, testing, technology, processing materials science, data mining, and statistics. Low yields on a high-volume manufacturing line can cost a company millions of dollars a day. Your industry needs competent analysts to help solve these problems.

By focusing on a Do It Right the First-Time approach to the analysis, participants will learn the appropriate methodology to successfully locate defects, characterize them, and determine the root cause of failure. 

Participants learn to develop the skills to determine what tools and techniques should be applied, and when they should be applied. This skill-building series is divided into four segments:

1. Yield Concepts
2. Test Structures for Evaluating Yield
3. Data Mining Techniques
4. The Process of Yield Analysis

Learning Objectives:

• Identify the advantages and disadvantages of a wide variety of tools and techniques that are used for yield analysis.
• Review a wide variety of yield visualization techniques that can be used to understand and characterize yield problems.
• Identify basic yield models and equations and their applicability to a variety of semiconductor devices.
• Identify a variety of different failure mechanisms and how they manifest themselves.
• Identify appropriate tools to purchase when starting or expanding a laboratory. 

Course Topics

• Introduction to Yield
• Yield Terms and Definitions
• Where is Yield Used in the Manufacturing Process?
• Yield Comparisons (ZYWE)
• Models for Yield Prediction
• Poisson
• Murphy
• Seeds
• Bose-Einstein
• Other treatments
• In-class exercises: Yield Calculations
• Gathering information
• Parametric Test Structures
• Yield Enhancement Techniques
• Random Defects
• Systematic Defects
• Defect Analysis and Yield Loss
• Defects in Semiconductor Components
• Particles
• Contamination
• Variability
• Which Defects cause Yield Loss
• Kill Ratio of Defects
• Data Mining
• Electrical Data
• Metrology
• Wafer Maps/Spatial Data
• Correlation Techniques
• Overview of Electrical Testing
• Test Structures, Testing, and Yield
• Correlation between Yield and Reliability
• Defect Densities and Yield
• Test Structures and Statistics for Determining Reliability
• Shallow Trench Isolation
• Transistors and Transistor Chains
• Contact/Via Test Structures
• Metallization Test Structures
• Ring Oscillators
• SRAM Test Structures
• Other Short Loop Structures
• Critical Area Analysis
• Basic Concept
• Issues
• Software tools

Cancellation and Rescheduling Policies   

·     Registrants may cancel or reschedule a class no less than 30 days before the class start date. 

·       Cancellations received after the stated deadline will not be eligible for a refund.

·       Cancellations will be accepted via email to semiu-support@semi.org

·       All refund requests must be made by the registrant or the credit card holder.

·       Refund requests must include the name of the attendee, Course Name, and date of the session.     

·       Refunds will be credited to the original payment method used for payment.

·       SEMI reserves the right to cancel any course due to low enrollment or other circumstances which would make the event unavailable 7 business days prior to the class's start date.

·       If SEMI cancels a class, the registrants will be offered a full refund. 

At no time are travel reservations made by the registrant, refundable by SEMI, whether the class cancellation is initiated by SEMI or the registrant.  This includes flight fees, hotel reservations, car and or ground transportation costs, or cancellation fees.