PV02900 - SEMI PV29 - Specification for Front Surface Marking of PV Silicon Wafers with Two-Dimensional Matrix Symbols

Volume(s): Photovoltaic
Language: English
Type: Single Standards Download (.pdf)
Abstract

This Standard was technically approved by the Photovoltaic – Automation Global Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on December 24, 2011. Available at www.semiviews.org and www.semi.org in October 2018; originally published February 2012.

 

This Specification defines the position and size of the two-dimensional matrix symbols excludes the occluding possibility of gridlines to increase the success probability of reading.

 

This Specification defines the position of the two-dimensional matrix symbols supplements serial alphanumeric marking to improve the chance of artificial reading and success possibility. If the fingers block the two-dimensional code, as substitute the alphanumeric code will work, which can make applicability of the standards more widely.

 

Position change of the two-dimensional and alphanumeric code can reduce negative effect of the code in the wafer center, on the cell capability.

 

This Specification defines the reading window to increase the success probability of reading.

 

A prerequisite for quality and process control in manufacturing of silicon wafers and solar cells is the traceability and track ability of the individual wafers.

 

The current specification defines a mark containing a data matrix code (DMC) that will allow to uniquely identifying wafers throughout the manufacturing process chain of solar cells and solar modules and their complete life cycle.

 

The specified mark can be easily applied and read, and is designed for stability throughout all solar cell and module manufacturing steps. Negative effects for this type of laser mark, such as increase of wafer breakage or reduction solar cell efficiency, have not been found in careful investigations performed on a large number of wafers and solar cells. This mark is independent of the positional orientation of the wafer.

 

Marks are widely used for identifying tracking and tracing wafers in the semiconductor industry. Therefore, equipment for applying and reading marks is easily available.

 

An additional advantage of a unique wafer mark is product security for producers and users of wafers and solar cells with respect to fraud, theft and counterfeiting.

 

This Specification covers an identification code, the geometric and spatial relationship and content (serial alphanumeric codes supplemented) of identification codes. This specification requires that identification code to be machine-readable (especially two-dimensional matrix codes) and human-readable (especially serial alphanumeric codes), for marking of square or pseudo-square mono- and multicrystalline silicon wafers for photovoltaic application.

 

 

Referenced SEMI Standards

SEMI M12 — Specification for Serial Alphanumeric Marking of the Front Surface of Wafers
SEMI MF728 — Practice for Preparing an Optical Microscope for Dimensional Measurements

Related Products
Interested in purchasing additional SEMI Standards?

Consider SEMIViews, an online portal with access to over 1000 Standards.

Refund Policy: Due to the nature of our products, SEMI has a no refund/no exchange policy. Please make sure that you have reviewed your order prior to finalizing your purchase. All sales are final.

Member Price: $113.00
Regular price Non-Member Price: $150.00