SEMI PV73 - Test Method for Thin-Film Silicon Photovoltaic (PV) Modules Light Soaking
This Standard was technically approved by the Photovoltaic Global Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on February 1, 2016. Available at www.semiviews.org and www.semi.org in February 2016.
This Standard provides a performance test method for the initial light-induced degradation in thin-film silicon photovoltaic (PV) modules.
The current standard for stabilization in thin-film silicon PV modules is IEC 61646 (module output power <2% change after successive 43 kW/m2 exposure periods). According to the IEC standard, light soaking time less than 200 hours is usually sufficient for 1 kW/m2 intensity. However, stabilized power to be achieved in such a short time and the power will continue to degrade. Thus, longer light soaking time is necessary to determine the module’s stabilized output power.
Therefore, a standard test method for thin-film silicon PV modules is needed to obtain an accurate module stabilized output power value.
This Standard describes procedures for the measurement of initial light-induced degradation of thin-film silicon modules in simulated sunlight.
These test methods are applicable to thin-film silicon PV modules.
Referenced SEMI Standards
|Interested in purchasing additional SEMI Standards? Consider SEMIViews, an online portal with access to over 1000 Standards.|