SEMI PV79 - Test Method for Exposure Durability of Photovoltaic (PV) Cells to Acetic Acid Vapor -

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Volume(s): Photovoltaic
Language: English
Type: Single Standards Download (.pdf)
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Revision: SEMI PV79-1125 - Current + Redline

Revision

Abstract

 

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1  Purpose
1.1  The current collection failure induced by the corrosion in finger electrodes on photovoltaic (PV) cells has been elucidated as a major degradation cause of crystalline silicon (c-Si) PV modules installed in hot-humid climate.
1.2  However, in the current damp heat stress test for PV modules, thousands of hours requires in the confirmation of this corroding phenomenon.
1.3  Therefore, the test method is proposed to reduce the test period, which is to directly expose PV cells to acetic acid vapor at high-temperature and -humidity conditions.
1.4  To evaluate the corrosion impact of bills of materials and the module structure, different acid concentration testing methods have been incorporated, taking into account the amount of acid generated within photovoltaic (PV) modules. The selection of the appropriate method should be determined by the user based on the specific requirements of their product.
2  Scope
2.1  This Test Method is a comparative test method between a reference PV cell and PV cells to be tested. Reference cell is a type of PV cell with known durability and exhibits high reproducibility when subjected to the same aging procedures.
2.2  This Test Method assesses relative durability of c-Si PV cells to acetic acid vapor in hygrothermal conditions.
2.3  This Test Method detects the alterations in current-voltage characteristics of PV cells and in AC impedance characteristics (refer to Figure 1).
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Referenced SEMI Standards (purchase separately)
SEMI M59 — Terminology for Silicon Technology
NOTICE: Unless otherwise indicated, all documents cited shall be the latest published versions.

 

Revision History
SEMI PV79-1125 (technical revision)
SEMI PV79-0818 (technical revision)
SEMI PV79-0817 (first published)

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