SEMI PV95 - Test Method for Metal Wrap Through Solar Cell Via Resistance -
Abstract
The purpose of
this Document is to standardize a fast and accurate test method
for determining metallized vias resistance of metal wrap through (MWT) solar cells. The vias are a must and key design for MWT cells. The metallization within vias plays an important role for the performance
of MWT solar cells because the generated current collected by the front fingers
will be transferred through the vias to the rear side of the cells. If vias metallization is not fully optimized, there will be poor contact between
the front finger and the rear pad. This
kind of contacts increases the series
resistance which results in the decrease of the fill
factor and finally bad electrical performance on cell. It is necessary to setup the standardization of
vias’ testing method.
This Standard defines the testing method to determine the resistance of
metallized-vias in MWT solar cells.
Referenced SEMI Standards (purchase separately)
None.
Interested in purchasing additional SEMI Standards? Consider SEMIViews, an online portal with access to over 1000 Standards. |
Refund Policy: Due to the nature of our products, SEMI has a no refund/no exchange policy. Please make sure that you have reviewed your order prior to finalizing your purchase. All sales are final.
This product has no reviews yet.