SEMI PV95 - Test Method for Metal Wrap Through Solar Cell Via Resistance -

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Volume(s): Photovoltaic
Language: English
Type: Single Standards Download (.pdf)
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Revision: SEMI PV95-0820 - Current

Revision

Abstract

The purpose of this Document is to standardize a fast and accurate test method for determining metallized vias resistance of metal wrap through (MWT) solar cells. The vias are a must and key design for MWT cells. The metallization within vias plays an important role for the performance of MWT solar cells because the generated current collected by the front fingers will be transferred through the vias to the rear side of the cells. If vias metallization is not fully optimized, there will be poor contact between the front finger and the rear pad. This kind of contacts increases the series resistance which results in the decrease of the fill factor and finally bad electrical performance on cell. It is necessary to setup the standardization of vias’ testing method.


This Standard defines the testing method to determine the resistance of metallized-vias in MWT solar cells.


Referenced SEMI Standards (purchase separately)

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