Semiconductor Metrology Basics

Course Description

The THORS Semiconductor Metrology Basics course introduces the learners to the significance of testing in semiconductor manufacturing. This course focuses on key measurements in semiconductor metrology for defect inspection and process control. Presented in THORS' highly visual and interactive learning format, this course will equip the learners with a foundational knowledge of semiconductor metrology. 

Learning Objectives

•  Recognize the significance of metrology in semiconductor manufacturing.

•  Identify the types and causes of defects.

•  Classify defects based on the pattern of their occurrence on the wafer.

•  Recognize the methods used for defect review.

• Explain the key parameters required to characterize and control semiconductor manufacturing processes. 

Course Duration 

1.5 hours

Target Audience

Quality, manufacturing, engineering, designing, testing, purchasing, and sales functions at organizations that require a comprehensive understanding of the processes involved in semiconductor metrology, from defect inspection to semiconductor process metrology.