SEMI T10 - Test Method for the Assessment of 2D Data Matrix Direct Mark Quality
This Standard was technically approved by the Traceability Global Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on February 1, 2018. Available at www.semiviews.org and www.semi.org in June 2018; originally published July 2001; previously published September 2012.
This Standard is intended to define the methodology for the assessment of 2D Data Matrix direct mark quality.
This Standard defines assessment criteria, metrology methods, and assessment reporting procedures as applied to 2D Data Matrix code direct marks on semiconductor related materials. Application specifications, which refer to this Standard, may further limit its scope to more specific requirements of a particular application.
Referenced SEMI Standards
|Interested in purchasing additional SEMI Standards? Consider SEMIViews, an online portal with access to over 1000 Standards.|
Refund Policy: Due to the nature of our products, SEMI has a no refund/no exchange policy. Please make sure that you have reviewed your order prior to finalizing your purchase. All sales are final.