T01900 - SEMI T19 - Specification for Device Marking
This Standard was technically approved by the Traceability Global Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on February 2, 2017. Available at www.semiviews.org and www.semi.org in July 2017; originally published July 2008; previously published March 2011.
The purpose of this Document is to establish a standard specification of marking on semiconductor devices to identify individual device by unique identification code and possible optional information to suggest a part of manufacturing information.
This Specification ranges from bare semiconductor dice to be packaged or assembled devices.
While this Document specifies physical interface of marking depending on one or more available technologies, it doesn’t restrict specific means of writing, reading alignment and so on.
This Document also handles a part of logical interface about the information of the marking.
This Document does not specify specific means to mark (writing) nor to identify (reading) the mark but guide possible ones implicitly with geometric requirements.
Referenced SEMI Standards
SEMI T13 — Specification for Device Tracking: Concepts, Behavior and Services
SEMI T14 — Specification for Micro ID on 300 mm Silicon Wafers
|Interested in purchasing additional SEMI Standards? Consider SEMIViews, an online portal with access to over 1000 Standards.|
Refund Policy: Due to the nature of our products, SEMI has a no refund/no exchange policy. Please make sure that you have reviewed your order prior to finalizing your purchase. All sales are final.