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1627 products

MF067100 - SEMI MF671 - Test Method for Measuring Flat Length on Wafers of Silicon and Other Electronic Materials
SEMI MF671 - Test Method for Measuring Flat Length on Wafers of Silicon and Other Electronic Materials Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF057600 - SEMI MF576 - Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry
SEMI MF576 - Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF053300 - SEMI MF533 - Test Method for Thickness and Thickness Variation of Silicon Wafers
SEMI MF533 - Test Method for Thickness and Thickness Variation of Silicon Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF052500 - SEMI MF525 - Test Method for Measuring Resistivity of Silicon Wafers Using a Spreading Resistance Probe
SEMI MF525 - Test Method for Measuring Resistivity of Silicon Wafers Using a Spreading Resistance Probe Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF052300 - SEMI MF523 - Practice for Unaided Visual Inspection of Polished Silicon Wafer Surfaces
SEMI MF523 - Practice for Unaided Visual Inspection of Polished Silicon Wafer Surfaces Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF004300 - SEMI MF43 - Test Method for Resistivity of Semiconductor Materials
SEMI MF43 - Test Method for Resistivity of Semiconductor Materials Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF004200 - SEMI MF42 - Test Method for Conductivity Type of Extrinsic Semiconducting Materials
SEMI MF42 - Test Method for Conductivity Type of Extrinsic Semiconducting Materials Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF039700 - SEMI MF397 - Test Method for Resistivity of Silicon Bars Using a Two-Point Probe
SEMI MF397 - Test Method for Resistivity of Silicon Bars Using a Two-Point Probe Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF039100 - SEMI MF391 - Test Method for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage
SEMI MF391 - Test Method for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF037400 - SEMI MF374 - Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure
SEMI MF374 - Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF002800 - SEMI MF28 - Test Method for Minority Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductivity Decay
SEMI MF28 - Test Method for Minority Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductivity Decay Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF002600 - SEMI MF26 - Test Method for Determining the Orientation of a Semiconductive Single Crystal
SEMI MF26 - Test Method for Determining the Orientation of a Semiconductive Single Crystal Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF213900 - SEMI MF2139 - Test Method for Measuring Nitrogen Concentration in Silicon Substrates by Secondary Ion Mass Spectrometry
SEMI MF2139 - Test Method for Measuring Nitrogen Concentration in Silicon Substrates by Secondary Ion Mass Spectrometry Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF207400 - SEMI MF2074 - Guide for Measuring Diameter of Silicon and Other Semiconductor Wafers
SEMI MF2074 - Guide for Measuring Diameter of Silicon and Other Semiconductor Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF198200 - SEMI MF1982 - Test Method for Analyzing Organic Contaminants on Silicon Wafer Surfaces by Thermal Desorption Gas Chromatography
SEMI MF1982 - Test Method for Analyzing Organic Contaminants on Silicon Wafer Surfaces by Thermal Desorption Gas Chromatography Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF181100 - SEMI MF1811 - Guide for Estimating the Power Spectral Density Function and Related Finish Parameters from Surface Profile Data
SEMI MF1811 - Guide for Estimating the Power Spectral Density Function and Related Finish Parameters from Surface Profile Data Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF181000 - SEMI MF1810 - Test Method for Counting Preferentially Etched or Decorated Surface Defects in Silicon Wafers
SEMI MF1810 - Test Method for Counting Preferentially Etched or Decorated Surface Defects in Silicon Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF180900 - SEMI MF1809 - Guide for Selection and Use of Etching Solutions to Delineate Structural Defects in Silicon
SEMI MF1809 - Guide for Selection and Use of Etching Solutions to Delineate Structural Defects in Silicon Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF177100 - SEMI MF1771 - Test Method for Evaluating Gate Oxide Integrity by Voltage Ramp Technique
SEMI MF1771 - Test Method for Evaluating Gate Oxide Integrity by Voltage Ramp Technique Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF176300 - SEMI MF1763 - Test Method for Measuring Contrast of a Linear Polarizer
SEMI MF1763 - Test Method for Measuring Contrast of a Linear Polarizer Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF172700 - SEMI MF1727 - Practice for Detection of Oxidation Induced Defects in Polished Silicon Wafers
SEMI MF1727 - Practice for Detection of Oxidation Induced Defects in Polished Silicon Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF172600 - SEMI MF1726 - Practice for Analysis of Crystallographic Perfection of Silicon Wafers
SEMI MF1726 - Practice for Analysis of Crystallographic Perfection of Silicon Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF172500 - SEMI MF1725 - Practice for Analysis of Crystallographic Perfection of Silicon Ingots
SEMI MF1725 - Practice for Analysis of Crystallographic Perfection of Silicon Ingots Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF163000 - SEMI MF1630 - Test Method for Low Temperature FT-IR Analysis of Single Crystal Silicon for III-V Impurities
SEMI MF1630 - Test Method for Low Temperature FT-IR Analysis of Single Crystal Silicon for III-V Impurities Sale priceMember Price: $144.00
Non-Member Price: $187.00
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