Newest Products – Page 63

2229 products

MF095000 - SEMI MF950 - Test Method for Measuring the Depth of Crystal Damage of a Mechanically Worked Silicon Wafer Surface by Angle Polished and Defect Etching

SEMI MF950 - Test Method for Measuring the Depth of Crystal Damage of a Mechanically Worked Silicon Wafer Surface by Angle Polished and Defect Etching

Member Price: $144.00
Non-Member Price: $187.00

MF092800 - SEMI MF928 - Test Method for Edge Contour of Circular Semiconductor Wafers and Rigid Disk Substrates

SEMI MF928 - Test Method for Edge Contour of Circular Semiconductor Wafers and Rigid Disk Substrates

Member Price: $144.00
Non-Member Price: $187.00

MF084700 - SEMI MF847 - Test Method for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques

SEMI MF847 - Test Method for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques

Member Price: $144.00
Non-Member Price: $187.00

MF008400 - SEMI MF84 - Test Method for Measuring Resistivity of Silicon Wafers With an In-Line Four-Point Probe

SEMI MF84 - Test Method for Measuring Resistivity of Silicon Wafers With an In-Line Four-Point Probe

Member Price: $144.00
Non-Member Price: $187.00

MF008100 - SEMI MF81 - Test Method for Measuring Radial Resistivity Variation on Silicon Wafers

SEMI MF81 - Test Method for Measuring Radial Resistivity Variation on Silicon Wafers

Member Price: $144.00
Non-Member Price: $187.00

MF072800 - SEMI MF728 - Practice for Preparing an Optical Microscope for Dimensional Measurements

SEMI MF728 - Practice for Preparing an Optical Microscope for Dimensional Measurements

Member Price: $144.00
Non-Member Price: $187.00

MF072300 - SEMI MF723 - Practice for Conversion Between Resistivity and Dopant or Carrier Density for Boron-Doped, Phosphorous-Doped, and Arsenic-Doped Silicon

SEMI MF723 - Practice for Conversion Between Resistivity and Dopant or Carrier Density for Boron-Doped, Phosphorous-Doped, and Arsenic-Doped Silicon

Member Price: $144.00
Non-Member Price: $187.00

MF067400 - SEMI MF674 - Practice for Preparing Silicon for Spreading Resistance Measurements

SEMI MF674 - Practice for Preparing Silicon for Spreading Resistance Measurements

Member Price: $144.00
Non-Member Price: $187.00

MF067300 - SEMI MF673 - Test Method for Measuring Resistivity of Semiconductor Wafers or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gauge

SEMI MF673 - Test Method for Measuring Resistivity of Semiconductor Wafers or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gauge

Member Price: $144.00
Non-Member Price: $187.00

MF067200 - SEMI MF672 - Guide for Measuring Resistivity Profiles Perpendicular to the Surface of a Silicon Wafer Using a Spreading Resistance Probe

SEMI MF672 - Guide for Measuring Resistivity Profiles Perpendicular to the Surface of a Silicon Wafer Using a Spreading Resistance Probe

Member Price: $144.00
Non-Member Price: $187.00

MF067100 - SEMI MF671 - Test Method for Measuring Flat Length on Wafers of Silicon and Other Electronic Materials

SEMI MF671 - Test Method for Measuring Flat Length on Wafers of Silicon and Other Electronic Materials

Member Price: $144.00
Non-Member Price: $187.00

$MF057600 - SEMI MF576 - Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry$

SEMI MF576 - Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry

Member Price: $144.00
Non-Member Price: $187.00

MF053300 - SEMI MF533 - Test Method for Thickness and Thickness Variation of Silicon Wafers

SEMI MF533 - Test Method for Thickness and Thickness Variation of Silicon Wafers

Member Price: $144.00
Non-Member Price: $187.00

MF052500 - SEMI MF525 - Test Method for Measuring Resistivity of Silicon Wafers Using a Spreading Resistance Probe

SEMI MF525 - Test Method for Measuring Resistivity of Silicon Wafers Using a Spreading Resistance Probe

Member Price: $144.00
Non-Member Price: $187.00

MF052300 - SEMI MF523 - Practice for Unaided Visual Inspection of Polished Silicon Wafer Surfaces

SEMI MF523 - Practice for Unaided Visual Inspection of Polished Silicon Wafer Surfaces

Member Price: $144.00
Non-Member Price: $187.00

MF004300 - SEMI MF43 - Test Method for Resistivity of Semiconductor Materials

SEMI MF43 - Test Method for Resistivity of Semiconductor Materials

Member Price: $144.00
Non-Member Price: $187.00

MF004200 - SEMI MF42 - Test Method for Conductivity Type of Extrinsic Semiconducting Materials

SEMI MF42 - Test Method for Conductivity Type of Extrinsic Semiconducting Materials

Member Price: $144.00
Non-Member Price: $187.00

MF039700 - SEMI MF397 - Test Method for Resistivity of Silicon Bars Using a Two-Point Probe

SEMI MF397 - Test Method for Resistivity of Silicon Bars Using a Two-Point Probe

Member Price: $144.00
Non-Member Price: $187.00

MF039100 - SEMI MF391 - Test Method for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage

SEMI MF391 - Test Method for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage

Member Price: $144.00
Non-Member Price: $187.00

MF037400 - SEMI MF374 - Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure

SEMI MF374 - Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure

Member Price: $144.00
Non-Member Price: $187.00

MF002800 - SEMI MF28 - Test Method for Minority Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductivity Decay

SEMI MF28 - Test Method for Minority Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductivity Decay

Member Price: $144.00
Non-Member Price: $187.00

MF002600 - SEMI MF26 - Test Method for Determining the Orientation of a Semiconductive Single Crystal

SEMI MF26 - Test Method for Determining the Orientation of a Semiconductive Single Crystal

Member Price: $144.00
Non-Member Price: $187.00

MF213900 - SEMI MF2139 - Test Method for Measuring Nitrogen Concentration in Silicon Substrates by Secondary Ion Mass Spectrometry

SEMI MF2139 - Test Method for Measuring Nitrogen Concentration in Silicon Substrates by Secondary Ion Mass Spectrometry

Member Price: $144.00
Non-Member Price: $187.00

MF207400 - SEMI MF2074 - Guide for Measuring Diameter of Silicon and Other Semiconductor Wafers

SEMI MF2074 - Guide for Measuring Diameter of Silicon and Other Semiconductor Wafers

Member Price: $144.00
Non-Member Price: $187.00