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SEMI MF1389 - Test Method for Photoluminescence Analysis of Single Crystal Silicon for III-V Impurities Sale priceMember Price: $144.00
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SEMI MF1388 - Test Method for Generation Lifetime and Generation Velocity of Silicon Material by Capacitance-Time Measurements of Metal-Oxide-Silicon (MOS) Capacitors Sale priceMember Price: $144.00
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SEMI MF1366 - Test Method for Measuring Oxygen Concentration in Heavily Doped Silicon Substrates by Secondary Ion Mass Spectrometry Sale priceMember Price: $144.00
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SEMI MF1239 - Test Method for Oxygen Precipitation Characteristics of Silicon Wafers by Measurement of Interstitial Oxygen Reduction Sale priceMember Price: $144.00
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SEMI MF1188 - Test Method for Interstitial Oxygen Content of Silicon by Infrared Absorption With Short Baseline Sale priceMember Price: $144.00
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SEMI MF1153 - Test Method for Characterization of Metal-Oxide Silicon (MOS) Structures by Capacitance-Voltage Measurements Sale priceMember Price: $144.00
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SEMI MF1152 - Test Method for Dimensions of Notches on Silicon Wafers Sale priceMember Price: $144.00
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SEMI MF110 - Test Method for Thickness of Epitaxial or Diffused Layers in Silicon by the Angle Lapping and Staining Technique Sale priceMember Price: $144.00
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SEMI MF1049 - Practice for Shallow Etch Pit Detection on Silicon Wafers Sale priceMember Price: $144.00
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SEMI MF1048 - Test Method for Measuring the Reflective Total Integrated Scatter Sale priceMember Price: $144.00
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SEMI ME1392 - Guide for Angle Resolved Optical Scatter Measurements on Specular or Diffuse Surfaces Sale priceMember Price: $144.00
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SEMI M9 - Specification for Polished Monocrystalline Gallium Arsenide Wafers Sale priceMember Price: $144.00
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SEMI M88 - Practice for Sample Preparation Methods for Measuring Minority Carrier Diffusion Length in Silicon Wafers by Surface Photovoltage Methods Sale priceMember Price: $144.00
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SEMI M87 - Test Method for Contactless Resistivity Measurement of Semi-Insulating Semiconductors Sale priceMember Price: $144.00
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SEMI M86 - Specification for Polished Monocrystalline c-Plane Gallium Nitride Wafers Sale priceMember Price: $144.00
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SEMI M85 - Guide for the Measurement of Trace Metal Contamination on Silicon Wafer Surface by Inductively Coupled Plasma Mass Spectrometry Sale priceMember Price: $144.00
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SEMI M84 - Specification for Polished Single Crystal Silicon Wafers for Gallium Nitride-On-Silicon Applications Sale priceMember Price: $144.00
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SEMI M83 - Test Method for Determination of Dislocation Etch Pit Density in Monocrystals of III-V Compound Semiconductors Sale priceMember Price: $144.00
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SEMI M82 - Test Method for the Carbon Acceptor Concentration in Semi-Insulating Gallium Arsenide Single Crystals by Infrared Absorption Spectroscopy Sale priceMember Price: $144.00
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SEMI M81 - Guide to Defects Found in Monocrystalline Silicon Carbide Substrates Sale priceMember Price: $144.00
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SEMI M8 - Specification for Polished Monocrystalline Silicon Test Wafers Sale priceMember Price: $144.00
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SEMI M80 - Specification for Front-Opening Shipping Box Used to Transport and Ship 450 mm Wafers Sale priceMember Price: $144.00
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SEMI M79 - Specification for Round 100 mm Polished Monocrystalline Germanium Wafers for Solar Cell Applications Sale priceMember Price: $144.00
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SEMI M78 - Guide for Determining Nanotopography of Unpatterned Silicon Wafers High Volume Manufacturing Sale priceMember Price: $144.00
Non-Member Price: $187.00