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M08100 - SEMI M81 - Guide to Defects Found in Monocrystalline Silicon Carbide Substrates
SEMI M81 - Guide to Defects Found in Monocrystalline Silicon Carbide Substrates Sale priceMember Price: $144.00
Non-Member Price: $187.00
M08100 - SEMI M81 - 単結晶シリコンカーバイド基板に存在する欠陥についてのガイド
M08200 - SEMI M82 - Test Method for the Carbon Acceptor Concentration in Semi-Insulating Gallium Arsenide Single Crystals by Infrared Absorption Spectroscopy
M08300 - SEMI M83 - Test Method for Determination of Dislocation Etch Pit Density in Monocrystals of III-V Compound Semiconductors
M08400 - SEMI M84 - Specification for Polished Single Crystal Silicon Wafers for Gallium Nitride-On-Silicon Applications
M08500 - SEMI M85 - Guide for the Measurement of Trace Metal Contamination on Silicon Wafer Surface by Inductively Coupled Plasma Mass Spectrometry
M08600 - SEMI M86 - Specification for Polished Monocrystalline c-Plane Gallium Nitride Wafers
SEMI M86 - Specification for Polished Monocrystalline c-Plane Gallium Nitride Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
M08700 - SEMI M87 - Test Method for Contactless Resistivity Measurement of Semi-Insulating Semiconductors
M08800 - SEMI M88 - Practice for Sample Preparation Methods for Measuring Minority Carrier Diffusion Length in Silicon Wafers by Surface Photovoltage Methods
M08900 - SEMI M89 - Test Method for Recombination Lifetime of the Epilayer of the Silicon Epitaxial Wafer (p/p+, n/n+) by the Short Wavelength Excitation Microwave Photoconductive Decay Method
M09000 - SEMI M90 - Test Method for Bulk Micro Defect Density and Denuded Zone Width in Annealed Silicon Wafers by Optical Microscopy After Preferential Etching
M09100 - SEMI M91 - Test Method for Determination of Threading Screw Dislocation Density in 4H-SIC by X-Ray Topography
M09200 - SEMI M92 - Specification for 4H-SIC Homoepitaxial Wafer
SEMI M92 - Specification for 4H-SIC Homoepitaxial Wafer Sale priceMember Price: $144.00
Non-Member Price: $187.00
M09300 - SEMI M93 - Test Method for Quantifying Basal Plane Dislocation Density in 4H-SiC by X-Ray Diffraction Topography/Imaging
M09400 - SEMI M94 - Specification for Silicon Carbide Engineered Substrates
SEMI M94 - Specification for Silicon Carbide Engineered Substrates Sale priceMember Price: $144.00
Non-Member Price: $187.00
Machine Learning Fundamentals: Principles and Application
Machine Learning Fundamentals: Principles and Application Sale priceMember Price: $499.00
Non-Member Price: $549.00
Machine Learning in Action: Tools, Techniques, & Industrial Cases
Machine Learning in Action: Tools, Techniques, & Industrial Cases Sale priceMember Price: $499.00
Non-Member Price: $549.00
Manufacturing Analytics
Manufacturing Analytics Sale priceMember Price: $499.00
Non-Member Price: $549.00
Mass Flow Controller Market Statistics Report
Mass Flow Controller Market Statistics Report Sale priceMember Price: $1,150.00
Non-Member Price: $2,300.00
Material Market Data Subscription (MMDS)
Material Market Data Subscription (MMDS) Sale priceMember Price: $4,300.00
Non-Member Price: $9,450.00
Materials Science for Semiconductors: Metals, Polymers & Ceramics
Materials Science for Semiconductors: Metals, Polymers & Ceramics Sale priceMember Price: $222.00
Non-Member Price: $297.00
ME139200 - SEMI ME1392 - Guide for Angle Resolved Optical Scatter Measurements on Specular or Diffuse Surfaces
Measurements:  Basic Concepts
Measurements: Basic Concepts Sale priceMember Price: $100.00
Non-Member Price: $120.00
Measurements: Measuring Processes
Measurements: Measuring Processes Sale priceMember Price: $260.00
Non-Member Price: $312.00