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MF065700 - SEMI MF657 - Test Method for Measuring Warp and Total Thickness Variation on Silicon Wafers by Noncontact Scanning
SEMI MF657 - Test Method for Measuring Warp and Total Thickness Variation on Silicon Wafers by Noncontact Scanning Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF067100 - SEMI MF671 - Test Method for Measuring Flat Length on Wafers of Silicon and Other Electronic Materials
SEMI MF671 - Test Method for Measuring Flat Length on Wafers of Silicon and Other Electronic Materials Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF067200 - SEMI MF672 - Guide for Measuring Resistivity Profiles Perpendicular to the Surface of a Silicon Wafer Using a Spreading Resistance Probe
SEMI MF672 - Guide for Measuring Resistivity Profiles Perpendicular to the Surface of a Silicon Wafer Using a Spreading Resistance Probe Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF067300 - SEMI MF673 - Test Method for Measuring Resistivity of Semiconductor Wafers or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gauge
SEMI MF673 - Test Method for Measuring Resistivity of Semiconductor Wafers or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gauge Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF067400 - SEMI MF674 - Practice for Preparing Silicon for Spreading Resistance Measurements
SEMI MF674 - Practice for Preparing Silicon for Spreading Resistance Measurements Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF072300 - SEMI MF723 - Practice for Conversion Between Resistivity and Dopant or Carrier Density for Boron-Doped, Phosphorous-Doped, and Arsenic-Doped Silicon
SEMI MF723 - Practice for Conversion Between Resistivity and Dopant or Carrier Density for Boron-Doped, Phosphorous-Doped, and Arsenic-Doped Silicon Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF072800 - SEMI MF728 - Practice for Preparing an Optical Microscope for Dimensional Measurements
SEMI MF728 - Practice for Preparing an Optical Microscope for Dimensional Measurements Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF084700 - SEMI MF847 - Test Method for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques
SEMI MF847 - Test Method for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF092800 - SEMI MF928 - Test Method for Edge Contour of Circular Semiconductor Wafers and Rigid Disk Substrates
SEMI MF928 - Test Method for Edge Contour of Circular Semiconductor Wafers and Rigid Disk Substrates Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF095000 - SEMI MF950 - Test Method for Measuring the Depth of Crystal Damage of a Mechanically Worked Silicon Wafer Surface by Angle Polished and Defect Etching
SEMI MF950 - Test Method for Measuring the Depth of Crystal Damage of a Mechanically Worked Silicon Wafer Surface by Angle Polished and Defect Etching Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF095100 - SEMI MF951 - Test Method for Determination of Radial Interstitial Oxygen Variation in Silicon Wafers
SEMI MF951 - Test Method for Determination of Radial Interstitial Oxygen Variation in Silicon Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF097800 - SEMI MF978 - Test Method for Characterizing Semiconductor Deep Levels by Transient Capacitance Techniques
SEMI MF978 - Test Method for Characterizing Semiconductor Deep Levels by Transient Capacitance Techniques Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF104800 - SEMI MF1048 - Test Method for Measuring the Reflective Total Integrated ScatterMF104800 - SEMI MF1048 - Test Method for Measuring the Reflective Total Integrated Scatter
SEMI MF1048 - Test Method for Measuring the Reflective Total Integrated Scatter Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF104900 - SEMI MF1049 - Practice for Shallow Etch Pit Detection on Silicon Wafers
SEMI MF1049 - Practice for Shallow Etch Pit Detection on Silicon Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF115200 - SEMI MF1152 - Test Method for Dimensions of Notches on Silicon Wafers
SEMI MF1152 - Test Method for Dimensions of Notches on Silicon Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF115300 - SEMI MF1153 - Test Method for Characterization of Metal-Oxide Silicon (MOS) Structures by Capacitance-Voltage Measurements
SEMI MF1153 - Test Method for Characterization of Metal-Oxide Silicon (MOS) Structures by Capacitance-Voltage Measurements Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF118800 - SEMI MF1188 - Test Method for Interstitial Oxygen Content of Silicon by Infrared Absorption With Short Baseline
SEMI MF1188 - Test Method for Interstitial Oxygen Content of Silicon by Infrared Absorption With Short Baseline Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF123900 - SEMI MF1239 - Test Method for Oxygen Precipitation Characteristics of Silicon Wafers by Measurement of Interstitial Oxygen Reduction
SEMI MF1239 - Test Method for Oxygen Precipitation Characteristics of Silicon Wafers by Measurement of Interstitial Oxygen Reduction Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF136600 - SEMI MF1366 - Test Method for Measuring Oxygen Concentration in Heavily Doped Silicon Substrates by Secondary Ion Mass Spectrometry
SEMI MF1366 - Test Method for Measuring Oxygen Concentration in Heavily Doped Silicon Substrates by Secondary Ion Mass Spectrometry Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF138800 - SEMI MF1388 - Test Method for Generation Lifetime and Generation Velocity of Silicon Material by Capacitance-Time Measurements of Metal-Oxide-Silicon (MOS) Capacitors
SEMI MF1388 - Test Method for Generation Lifetime and Generation Velocity of Silicon Material by Capacitance-Time Measurements of Metal-Oxide-Silicon (MOS) Capacitors Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF138900 - SEMI MF1389 - Test Method for Photoluminescence Analysis of Single Crystal Silicon for III-V Impurities
SEMI MF1389 - Test Method for Photoluminescence Analysis of Single Crystal Silicon for III-V Impurities Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF139000 - SEMI MF1390 - Test Method for Measuring Bow and Warp on Silicon Wafers by Automated Noncontact Scanning
SEMI MF1390 - Test Method for Measuring Bow and Warp on Silicon Wafers by Automated Noncontact Scanning Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF139100 - SEMI MF1391 - Test Method for Substitutional Atomic Carbon Content of Silicon by Infrared Absorption
SEMI MF1391 - Test Method for Substitutional Atomic Carbon Content of Silicon by Infrared Absorption Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF139200 - SEMI MF1392 - Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements with a Mercury Probe
SEMI MF1392 - Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements with a Mercury Probe Sale priceMember Price: $144.00
Non-Member Price: $187.00