Best selling category – Page 14

1845 products

E12700 - SEMI E127 - Specification for Integrated Measurement Module Communications: Concepts, Behavior, and Services (IMMC)

SEMI E127 - Specification for Integrated Measurement Module Communications: Concepts, Behavior, and Services (IMMC)

Member Price: $148.00
Non-Member Price: $193.00

S02500 - SEMI S25 - Safety Guideline for Hydrogen Peroxide Storage & Handling Systems

SEMI S25 - Safety Guideline for Hydrogen Peroxide Storage & Handling Systems

Member Price: $148.00
Non-Member Price: $193.00

PV05700 - SEMI PV57 - Test Method For Current-Voltage (I-V) Performance Measurement of Organic Photovoltaic (OPV) and Dye-Sensitized Solar Cell (DSSC) and Perovskite Solar Cell (PSC)

SEMI PV57 - Test Method For Current-Voltage (I-V) Performance Measurement of Organic Photovoltaic (OPV) and Dye-Sensitized Solar Cell (DSSC) and Perovskite Solar Cell (PSC)

Member Price : $148.00

PV04900 - SEMI PV49 - Test Method for the Measurement of Elemental Impurity Concentrations in Silicon Feedstock for Silicon Solar Cells by Bulk Digestion, Inductively Coupled-Plasma Mass Spectrometry

SEMI PV49 - Test Method for the Measurement of Elemental Impurity Concentrations in Silicon Feedstock for Silicon Solar Cells by Bulk Digestion, Inductively Coupled-Plasma Mass Spectrometry

Member Price: $148.00
Non-Member Price: $193.00

PV00200 - SEMI PV2 - Guide for PV Equipment Communication Interfaces (PVECI)

SEMI PV2 - Guide for PV Equipment Communication Interfaces (PVECI)

Member Price: $148.00
Non-Member Price: $193.00

PV01700 - SEMI PV17 - Specification for Virgin Silicon Feedstock Materials for Photovoltaic Applications

SEMI PV17 - Specification for Virgin Silicon Feedstock Materials for Photovoltaic Applications

Member Price: $148.00
Non-Member Price: $193.00

PV01300 - SEMI PV13 - Test Method for Contactless Excess-Charge-Carrier Recombination Lifetime Measurement in Silicon Wafers, Ingots, and Bricks Using an Eddy-Current Sensor

SEMI PV13 - Test Method for Contactless Excess-Charge-Carrier Recombination Lifetime Measurement in Silicon Wafers, Ingots, and Bricks Using an Eddy-Current Sensor

Member Price: $148.00
Non-Member Price: $193.00

PV00100 - SEMI PV1 - Test Method for Measuring Trace Elements in Silicon Feedstock for Silicon Solar Cells by High-Mass Resolution Glow Discharge Mass Spectrometry

SEMI PV1 - Test Method for Measuring Trace Elements in Silicon Feedstock for Silicon Solar Cells by High-Mass Resolution Glow Discharge Mass Spectrometry

Member Price: $148.00
Non-Member Price: $193.00

P00900 - SEMI P9 - Guide for Functional Testing of Microelectronic Resists

SEMI P9 - Guide for Functional Testing of Microelectronic Resists

Member Price: $148.00
Non-Member Price: $193.00

P04800 - SEMI P48 - Specification of Fiducial Marks for EUV Mask Blank

SEMI P48 - Specification of Fiducial Marks for EUV Mask Blank

Member Price: $148.00
Non-Member Price: $193.00

P02200 - SEMI P22 - Guideline for Photomask Defect Classification and Size Definition

SEMI P22 - Guideline for Photomask Defect Classification and Size Definition

Member Price: $148.00
Non-Member Price: $193.00

MF067300 - SEMI MF673 - Test Method for Measuring Resistivity of Semiconductor Wafers or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gauge

SEMI MF673 - Test Method for Measuring Resistivity of Semiconductor Wafers or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gauge

Member Price: $148.00
Non-Member Price: $193.00

SEMI MF1811 - Guide for Estimating the Power Spectral Density Function and Related Finish Parameters from Surface Profile Data

Member Price: $148.00
Non-Member Price: $193.00

MF161800 - SEMI MF1618 - Practice for Determination of Uniformity of Thin Films on Silicon Wafers

SEMI MF1618 - Practice for Determination of Uniformity of Thin Films on Silicon Wafers

Member Price: $148.00
Non-Member Price: $193.00

M00800 - SEMI M8 - Specification for Polished Monocrystalline Silicon Test Wafers

SEMI M8 - Specification for Polished Monocrystalline Silicon Test Wafers

Member Price: $148.00
Non-Member Price: $193.00

M07300 - SEMI M73 - Test Method for Extracting Relevant Characteristics from Measured Wafer Edge Profiles

SEMI M73 - Test Method for Extracting Relevant Characteristics from Measured Wafer Edge Profiles

Member Price: $148.00
Non-Member Price: $193.00

G07400 - SEMI G74 - Specification for Tape Frame for 300 mm Wafers

SEMI G74 - Specification for Tape Frame for 300 mm Wafers

Member Price: $148.00
Non-Member Price: $193.00

F03400 - SEMI F34 - Guide for Liquid Chemical Pipe Labeling

SEMI F34 - Guide for Liquid Chemical Pipe Labeling

Member Price: $148.00
Non-Member Price: $193.00

F04100 - SEMI F41 - Guide for Qualification of a Bulk Chemical Distribution System Used in Semiconductor Processing

SEMI F41 - Guide for Qualification of a Bulk Chemical Distribution System Used in Semiconductor Processing

Member Price: $148.00
Non-Member Price: $193.00

F04300 - SEMI F43 - Test Method for Determination of Particle Contribution by Point-of-Use Gas Purifiers and Gas Filters

SEMI F43 - Test Method for Determination of Particle Contribution by Point-of-Use Gas Purifiers and Gas Filters

Member Price: $148.00
Non-Member Price: $193.00

F04700 - SEMI F47 - 半導体プロセス装置電圧サグ対応力のための仕様

SEMI F47 - 半導体プロセス装置電圧サグ対応力のための仕様

Member Price: $344.00
Non-Member Price: $457.00

E08300 - SEMI E83 - Specification for PGV Mechanical Docking Flange

SEMI E83 - Specification for PGV Mechanical Docking Flange

Member Price: $148.00
Non-Member Price: $193.00

E07600 - SEMI E76 - Guide for 300 mm Process Equipment Points of Connection to Facility Services

SEMI E76 - Guide for 300 mm Process Equipment Points of Connection to Facility Services

Member Price: $148.00
Non-Member Price: $193.00

E06600 - SEMI E66 - Test Method for Determining Particle Contribution by Mass Flow Controllers

SEMI E66 - Test Method for Determining Particle Contribution by Mass Flow Controllers

Member Price: $148.00
Non-Member Price: $193.00