Best selling category

Filters

Price
to
Sort by:

1891 products

S02200 - SEMI S22 - 半導體製造設備電氣設計安全基準
S01400 - SEMI S14 - 반도체 제조 장비의 화재 위험성 평가 및 완화 안전 가이드라인
F09500 - SEMI F95 - Specification for Dimension of Three Port Components for 1.5 Inch Four Fastener Configuration Type Surface Mount Gas Distribution Systems
F09400 - SEMI F94 - Specification for Dimension of Two Port Components (Except MFC/MFM) for 1.5 Inch Four Fastener Configuration Type Surface Mount Gas Distribution SystemsF09400 - SEMI F94 - Specification for Dimension of Two Port Components (Except MFC/MFM) for 1.5 Inch Four Fastener Configuration Type Surface Mount Gas Distribution Systems
F08800 - SEMI F88 - Specification for Dimension of Standard Size Mass Flow Controllers and Mass Flow Meters for 1.5 Inch Type Surface Mount Gas Distribution Systems
F01300 - SEMI F13 - Guide for Gas Source Control Equipment
SEMI F13 - Guide for Gas Source Control Equipment Sale priceMember Price: $144.00
Non-Member Price: $187.00
F102000 - SEMI F102 - Guide for Selecting Specifications for Dimension of Components for Surface Mount Gas Distribution Systems
E07300 - SEMI E73 - Specification for Vacuum Pump Interfaces - Dry Pumps
SEMI E73 - Specification for Vacuum Pump Interfaces - Dry Pumps Sale priceMember Price: $144.00
Non-Member Price: $187.00
E12700 - SEMI E127 - Specification for Integrated Measurement Module Communications:  Concepts, Behavior, and Services (IMMC)
S02500 - SEMI S25 - Safety Guideline for Hydrogen Peroxide Storage & Handling Systems
SEMI S25 - Safety Guideline for Hydrogen Peroxide Storage & Handling Systems Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV05700 - SEMI PV57 - Test Method For Current-Voltage (I-V) Performance Measurement of Organic Photovoltaic (OPV) and Dye-Sensitized Solar Cell (DSSC) and Perovskite Solar Cell (PSC)
PV04900 - SEMI PV49 - Test Method for the Measurement of Elemental Impurity Concentrations in Silicon Feedstock for Silicon Solar Cells by Bulk Digestion, Inductively Coupled-Plasma Mass Spectrometry
PV00200 - SEMI PV2 - Guide for PV Equipment Communication Interfaces (PVECI)
SEMI PV2 - Guide for PV Equipment Communication Interfaces (PVECI) Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV01700 - SEMI PV17 - Specification for Virgin Silicon Feedstock Materials for Photovoltaic Applications
PV01300 - SEMI PV13 - Test Method for Contactless Excess-Charge-Carrier Recombination Lifetime Measurement in Silicon Wafers, Ingots, and Bricks Using an Eddy-Current Sensor
PV00100 - SEMI PV1 - Test Method for Measuring Trace Elements in Silicon Feedstock for Silicon Solar Cells by High-Mass Resolution Glow Discharge Mass Spectrometry
P00900 - SEMI P9 - Guide for Functional Testing of Microelectronic Resists
SEMI P9 - Guide for Functional Testing of Microelectronic Resists Sale priceMember Price: $144.00
Non-Member Price: $187.00
P04800 - SEMI P48 - Specification of Fiducial Marks for EUV Mask Blank
SEMI P48 - Specification of Fiducial Marks for EUV Mask Blank Sale priceMember Price: $144.00
Non-Member Price: $187.00
P02200 - SEMI P22 - Guideline for Photomask Defect Classification and Size Definition
SEMI P22 - Guideline for Photomask Defect Classification and Size Definition Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF067300 - SEMI MF673 - Test Method for Measuring Resistivity of Semiconductor Wafers or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gauge
MF181100 - SEMI MF1811 - Guide for Estimating the Power Spectral Density Function and Related Finish Parameters from Surface Profile Data
MF161800 - SEMI MF1618 - Practice for Determination of Uniformity of Thin Films on Silicon Wafers
SEMI MF1618 - Practice for Determination of Uniformity of Thin Films on Silicon Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
M00800 - SEMI M8 - Specification for Polished Monocrystalline Silicon Test Wafers
SEMI M8 - Specification for Polished Monocrystalline Silicon Test Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
M07300 - SEMI M73 - Test Method for Extracting Relevant Characteristics from Measured Wafer Edge Profiles