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1845 products

M07100 - SEMI M71 - Specification for Silicon-on-Insulator (SOI) Wafers for CMOS LSI
SEMI M71 - Specification for Silicon-on-Insulator (SOI) Wafers for CMOS LSI Sale priceMember Price: $148.00
Non-Member Price: $193.00
M06800 - SEMI M68 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Height Data Array Using a Curvature Metric, ZDD
M06200 - SEMI M62 - Specification for Silicon Epitaxial Wafers
M04300 - SEMI M43 - Guide for Reporting Wafer Nanotopography
SEMI M43 - Guide for Reporting Wafer Nanotopography Sale priceMember Price: $148.00
Non-Member Price: $193.00
M04000 - SEMI M40 - Guide for Measurement of Roughness of Planar Surfaces on Polished Wafers
SEMI M40 - Guide for Measurement of Roughness of Planar Surfaces on Polished Wafers Sale priceMember Price: $148.00
Non-Member Price: $193.00
M02000 - SEMI M20 - Practice for Establishing a Wafer Coordinate System
SEMI M20 - Practice for Establishing a Wafer Coordinate System Sale priceMember Price: $148.00
Non-Member Price: $193.00
HB00100 - SEMI HB1 - Specification for Sapphire Wafers Intended for Use for Manufacturing High Brightness-Light Emitting Diode Devices
HB01000 - SEMI HB10 - Specification for Single Crystal Sapphire Intended for Use for Manufacturing HB-LED Wafers
G06900 - SEMI G69 - Test Method for Measurement of Adhesive Strength Between Leadframes and Molding Compounds
F06400 - SEMI F64 - Test Method for Determining Pressure Effects on Indicated and Actual Flow for Mass Flow Controllers
F11300 - SEMI F113 - Test Method for Pressure Transducers Used in Gas Delivery Systems
SEMI F113 - Test Method for Pressure Transducers Used in Gas Delivery Systems Sale priceMember Price: $148.00
Non-Member Price: $193.00
F05000 - SEMI F50 - Guide for Electric Utility Voltage Sag Performance for Semiconductor Factories
F07200 - SEMI F72 - 不動態化処理した316Lステンレス鋼部品の接ガス表面の酸化膜のオージェ電子分光法(AES)による評価テスト方法
F06800 - SEMI F68 - Test Method for Determining Purifier Efficiency
SEMI F68 - Test Method for Determining Purifier Efficiency Sale priceMember Price: $148.00
Non-Member Price: $193.00
F05900 - SEMI F59 - Test Method for Determination of Filter or Gas System Flow Pressure Drop Curves
F03200 - SEMI F32 - Test Method for Determination of Flow Coefficient for High Purity Shutoff Valves
F09700 - SEMI F97 - Specification for Facility Package Integration, Monitoring and Control
SEMI F97 - Specification for Facility Package Integration, Monitoring and Control Sale priceMember Price: $148.00
Non-Member Price: $193.00
E07000 - SEMI E70 - Guide for Tool Accommodation Process
SEMI E70 - Guide for Tool Accommodation Process Sale priceMember Price: $148.00
Non-Member Price: $193.00
E05420 - SEMI E54.20 - Specification for Sensor/Actuator Network Communications for EtherCAT®
SEMI E54.20 - Specification for Sensor/Actuator Network Communications for EtherCAT® Sale priceMember Price: $148.00
Non-Member Price: $193.00
E04300 - SEMI E43 - 物体および表面上の静電気測定のためのガイド
SEMI E43 - 物体および表面上の静電気測定のためのガイド Sale priceMember Price: $176.00
Non-Member Price: $231.00
E02800 - SEMI E28 - Guide for Pressure Specifications of the Mass Flow Controller
SEMI E28 - Guide for Pressure Specifications of the Mass Flow Controller Sale priceMember Price: $148.00
Non-Member Price: $193.00
E16300 - SEMI E163 - Guide for the Handling of Reticles and Other Extremely Electrostatic Sensitive (EES) Items Within Specially Designated Areas
E15800 - SEMI E158 - Specification for Mechanical Features of Fab Wafer Carrier Used to Transport and Store 450 mm Wafers (450 FOUP) and Kinematic Coupling
E15400 - SEMI E154 - Specification for Mechanical Features of 450 mm Load Port
SEMI E154 - Specification for Mechanical Features of 450 mm Load Port Regular price$300.00 USD Sale price$193.00 USD