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SEMI M71 - Specification for Silicon-on-Insulator (SOI) Wafers for CMOS LSI
Sale priceMember Price: $148.00
Non-Member Price: $193.00
Non-Member Price: $193.00
SEMI M68 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Height Data Array Using a Curvature Metric, ZDD
Sale priceMember Price: $148.00
Non-Member Price: $193.00
Non-Member Price: $193.00
SEMI M62 - Specification for Silicon Epitaxial Wafers
Sale price
Member Price : $148.00
SEMI M43 - Guide for Reporting Wafer Nanotopography
Sale priceMember Price: $148.00
Non-Member Price: $193.00
Non-Member Price: $193.00
SEMI M40 - Guide for Measurement of Roughness of Planar Surfaces on Polished Wafers
Sale priceMember Price: $148.00
Non-Member Price: $193.00
Non-Member Price: $193.00
SEMI M20 - Practice for Establishing a Wafer Coordinate System
Sale priceMember Price: $148.00
Non-Member Price: $193.00
Non-Member Price: $193.00
SEMI HB1 - Specification for Sapphire Wafers Intended for Use for Manufacturing High Brightness-Light Emitting Diode Devices
Sale priceMember Price: $148.00
Non-Member Price: $193.00
Non-Member Price: $193.00
SEMI HB10 - Specification for Single Crystal Sapphire Intended for Use for Manufacturing HB-LED Wafers
Sale priceMember Price: $148.00
Non-Member Price: $193.00
Non-Member Price: $193.00
SEMI G69 - Test Method for Measurement of Adhesive Strength Between Leadframes and Molding Compounds
Sale priceMember Price: $148.00
Non-Member Price: $193.00
Non-Member Price: $193.00
SEMI F64 - Test Method for Determining Pressure Effects on Indicated and Actual Flow for Mass Flow Controllers
Sale priceMember Price: $148.00
Non-Member Price: $193.00
Non-Member Price: $193.00
SEMI F113 - Test Method for Pressure Transducers Used in Gas Delivery Systems
Sale priceMember Price: $148.00
Non-Member Price: $193.00
Non-Member Price: $193.00
SEMI F50 - Guide for Electric Utility Voltage Sag Performance for Semiconductor Factories
Sale priceMember Price: $148.00
Non-Member Price: $193.00
Non-Member Price: $193.00
SEMI F72 - 不動態化処理した316Lステンレス鋼部品の接ガス表面の酸化膜のオージェ電子分光法(AES)による評価テスト方法
Sale priceMember Price: $176.00
Non-Member Price: $231.00
Non-Member Price: $231.00
SEMI F68 - Test Method for Determining Purifier Efficiency
Sale priceMember Price: $148.00
Non-Member Price: $193.00
Non-Member Price: $193.00
SEMI F59 - Test Method for Determination of Filter or Gas System Flow Pressure Drop Curves
Sale priceMember Price: $148.00
Non-Member Price: $193.00
Non-Member Price: $193.00
SEMI F32 - Test Method for Determination of Flow Coefficient for High Purity Shutoff Valves
Sale priceMember Price: $148.00
Non-Member Price: $193.00
Non-Member Price: $193.00
SEMI F97 - Specification for Facility Package Integration, Monitoring and Control
Sale priceMember Price: $148.00
Non-Member Price: $193.00
Non-Member Price: $193.00
SEMI E70 - Guide for Tool Accommodation Process
Sale priceMember Price: $148.00
Non-Member Price: $193.00
Non-Member Price: $193.00
SEMI E54.20 - Specification for Sensor/Actuator Network Communications for EtherCAT®
Sale priceMember Price: $148.00
Non-Member Price: $193.00
Non-Member Price: $193.00
SEMI E43 - 物体および表面上の静電気測定のためのガイド
Sale priceMember Price: $176.00
Non-Member Price: $231.00
Non-Member Price: $231.00
SEMI E28 - Guide for Pressure Specifications of the Mass Flow Controller
Sale priceMember Price: $148.00
Non-Member Price: $193.00
Non-Member Price: $193.00
SEMI E163 - Guide for the Handling of Reticles and Other Extremely Electrostatic Sensitive (EES) Items Within Specially Designated Areas
Sale priceMember Price: $148.00
Non-Member Price: $193.00
Non-Member Price: $193.00
SEMI E158 - Specification for Mechanical Features of Fab Wafer Carrier Used to Transport and Store 450 mm Wafers (450 FOUP) and Kinematic Coupling
Regular price$300.00 USD
Sale price$193.00 USD
SEMI E154 - Specification for Mechanical Features of 450 mm Load Port
Regular price$300.00 USD
Sale price$193.00 USD
























