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1845 products

S01200 - SEMI S12 - 設備除污基準
SEMI S12 - 設備除污基準 Sale priceMember Price: $148.00
Non-Member Price: $193.00
F09600 - SEMI F96 - Specification for Port Configuration of Canisters to Contain CVD Precursors
SEMI F96 - Specification for Port Configuration of Canisters to Contain CVD Precursors Regular price$300.00 USD Sale price$193.00 USD
F08700 - SEMI F87 - Specification for Dimension of Three Port Components (Except MFC/MFM) for 1.125 Inch Type Four Fastener Configuration Surface Mount Gas Distribution Systems
SEMI F87 - Specification for Dimension of Three Port Components (Except MFC/MFM) for 1.125 Inch Type Four Fastener Configuration Surface Mount Gas Distribution Systems Sale priceMember Price: $148.00
Non-Member Price: $193.00
F02700 - SEMI F27 - Test Method for Moisture Interaction and Content of Gas Distribution Systems and Components by Atmospheric Pressure Ionization Mass Spectrometry (APIMS)
SEMI F27 - Test Method for Moisture Interaction and Content of Gas Distribution Systems and Components by Atmospheric Pressure Ionization Mass Spectrometry (APIMS) Sale priceMember Price: $148.00
Non-Member Price: $193.00
F01000 - SEMI F10 - Test Method to Determine the Internal Pressure Required to Produce a Failure of a Tube Fitting Connection Made of Fluorocarbon Materials
SEMI F10 - Test Method to Determine the Internal Pressure Required to Produce a Failure of a Tube Fitting Connection Made of Fluorocarbon Materials Regular price$300.00 USD Sale price$193.00 USD
E09800 - SEMI E98 - Provisional Standard for the Object-Based Equipment Model (OBEM)
SEMI E98 - Provisional Standard for the Object-Based Equipment Model (OBEM) Sale priceMember Price: $148.00
Non-Member Price: $193.00
E08100 - SEMI E81 - Provisional Specification for CIM Framework Domain Architecture
SEMI E81 - Provisional Specification for CIM Framework Domain Architecture Sale priceMember Price: $148.00
Non-Member Price: $193.00
E06400 - SEMI E64 - Specification for 300 mm Cart to SEMI E15.1 Docking Interface Port
SEMI E64 - Specification for 300 mm Cart to SEMI E15.1 Docking Interface Port Sale priceMember Price: $148.00
Non-Member Price: $193.00
E04600 - SEMI E46 - Test Method for the Determination of Organic Contamination from Minienvironments Using Ion Mobility Spectrometry (IMS)
SEMI E46 - Test Method for the Determination of Organic Contamination from Minienvironments Using Ion Mobility Spectrometry (IMS) Sale priceMember Price: $148.00
Non-Member Price: $193.00
E03200 - SEMI E32 - Material Movement Management (MMM)
SEMI E32 - Material Movement Management (MMM) Sale priceMember Price: $148.00
Non-Member Price: $193.00
T00900 - SEMI T9 - Specification for Marking of Metal Lead-Frame Strips with a Two-Dimensional Data Matrix Code Symbol
SEMI T9 - Specification for Marking of Metal Lead-Frame Strips with a Two-Dimensional Data Matrix Code Symbol Sale priceMember Price: $148.00
Non-Member Price: $193.00
S02600 - SEMI S26 - Environmental, Health, and Safety Guideline for FPD Manufacturing System
SEMI S26 - Environmental, Health, and Safety Guideline for FPD Manufacturing System Sale priceMember Price: $148.00
Non-Member Price: $193.00
S01700 - SEMI S17 - 無人搬運車（UTV）系統之安全基準
SEMI S17 - 無人搬運車（UTV）系統之安全基準 Sale priceMember Price: $148.00
Non-Member Price: $193.00
PV00900 - SEMI PV9 - Test Method for Excess Charge Carrier Decay in PV Silicon Materials by Non-Contact Measurements of Microwave Reflectance After a Short Illumination Pulse
SEMI PV9 - Test Method for Excess Charge Carrier Decay in PV Silicon Materials by Non-Contact Measurements of Microwave Reflectance After a Short Illumination Pulse Sale priceMember Price: $148.00
Non-Member Price: $193.00
PV07600 - SEMI PV76 - Test Method for Durability of Low Light Intensity Organic Photovoltaic (OPV) and Dye-Sensitized Solar Cell (DSSC) and Perovskite Solar Cell (PSC)
SEMI PV76 - Test Method for Durability of Low Light Intensity Organic Photovoltaic (OPV) and Dye-Sensitized Solar Cell (DSSC) and Perovskite Solar Cell (PSC) Sale priceMember Price: $148.00
Non-Member Price: $193.00
PV05400 - SEMI PV54 - Specification for Silver Paste, Used to Contact with N+ Diffusion Layer of Crystalline Silicon Solar Cells
SEMI PV54 - Specification for Silver Paste, Used to Contact with N+ Diffusion Layer of Crystalline Silicon Solar Cells Sale priceMember Price: $148.00
Non-Member Price: $193.00
PV0036 - SEMI PV36 - Specification for Hydrogen Peroxide Used in Photovoltaic Applications
SEMI PV36 - Specification for Hydrogen Peroxide Used in Photovoltaic Applications Sale priceMember Price: $148.00
Non-Member Price: $193.00
PV01800 - SEMI PV18 - Guide for Specifying a Photovoltaic Connector Ribbon
SEMI PV18 - Guide for Specifying a Photovoltaic Connector Ribbon Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF213900 - SEMI MF2139 - Test Method for Measuring Nitrogen Concentration in Silicon Substrates by Secondary Ion Mass Spectrometry
SEMI MF2139 - Test Method for Measuring Nitrogen Concentration in Silicon Substrates by Secondary Ion Mass Spectrometry Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF163000 - SEMI MF1630 - Test Method for Low Temperature FT-IR Analysis of Single Crystal Silicon for III-V Impurities
SEMI MF1630 - Test Method for Low Temperature FT-IR Analysis of Single Crystal Silicon for III-V Impurities Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF139100 - SEMI MF1391 - Test Method for Substitutional Atomic Carbon Content of Silicon by Infrared Absorption
SEMI MF1391 - Test Method for Substitutional Atomic Carbon Content of Silicon by Infrared Absorption Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF138900 - SEMI MF1389 - Test Method for Photoluminescence Analysis of Single Crystal Silicon for III-V Impurities
SEMI MF1389 - Test Method for Photoluminescence Analysis of Single Crystal Silicon for III-V Impurities Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF011000 - SEMI MF110 - Test Method for Thickness of Epitaxial or Diffused Layers in Silicon by the Angle Lapping and Staining Technique
SEMI MF110 - Test Method for Thickness of Epitaxial or Diffused Layers in Silicon by the Angle Lapping and Staining Technique Sale priceMember Price: $148.00
Non-Member Price: $193.00
M00900 - SEMI M9 - Specification for Polished Monocrystalline Gallium Arsenide Wafers
SEMI M9 - Specification for Polished Monocrystalline Gallium Arsenide Wafers Sale priceMember Price: $148.00
Non-Member Price: $193.00