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P04700 - SEMI P47 - Test Method for Evaluation of Line-Edge Roughness and Linewidth Roughness
SEMI P47 - Test Method for Evaluation of Line-Edge Roughness and Linewidth Roughness Sale priceMember Price: $148.00
Non-Member Price: $193.00
E01000 - SEMI E10 - 半導体製造装置の信頼性，有用性，整備性（RAM），利用性の定義と測定のための仕様
SEMI E10 - 半導体製造装置の信頼性，有用性，整備性（RAM），利用性の定義と測定のための仕様 Sale priceMember Price: $176.00
Non-Member Price: $231.00
S01500 - SEMI S15 - Safety Guideline for the Evaluation of Toxic and Flammable Gas Detection Systems
SEMI S15 - Safety Guideline for the Evaluation of Toxic and Flammable Gas Detection Systems Sale priceMember Price: $148.00
Non-Member Price: $193.00
S01000 - SEMI S10 - 위험성 평가 및 위험성 검토 절차 안전 가이드라인
SEMI S10 - 위험성 평가 및 위험성 검토 절차 안전 가이드라인 Sale priceMember Price: $148.00
Non-Member Price: $193.00
E10100 - SEMI E101 - Guide for EFEM Functional Structure Model
SEMI E101 - Guide for EFEM Functional Structure Model Sale priceMember Price: $148.00
Non-Member Price: $193.00
S02100 - SEMI S21 - Safety Guideline for Worker Protection
SEMI S21 - Safety Guideline for Worker Protection Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF067300 - SEMI MF673 - Test Method for Measuring Resistivity of Semiconductor Wafers or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gauge
SEMI MF673 - Test Method for Measuring Resistivity of Semiconductor Wafers or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gauge Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF002600 - SEMI MF26 - Test Method for Determining the Orientation of a Semiconductive Single Crystal
SEMI MF26 - Test Method for Determining the Orientation of a Semiconductive Single Crystal Sale priceMember Price: $148.00
Non-Member Price: $193.00
M00900 - SEMI M9 - Specification for Polished Monocrystalline Gallium Arsenide Wafers
SEMI M9 - Specification for Polished Monocrystalline Gallium Arsenide Wafers Sale priceMember Price: $148.00
Non-Member Price: $193.00
M02000 - SEMI M20 - Practice for Establishing a Wafer Coordinate System
SEMI M20 - Practice for Establishing a Wafer Coordinate System Sale priceMember Price: $148.00
Non-Member Price: $193.00
F04100 - SEMI F41 - Guide for Qualification of a Bulk Chemical Distribution System Used in Semiconductor Processing
SEMI F41 - Guide for Qualification of a Bulk Chemical Distribution System Used in Semiconductor Processing Sale priceMember Price: $148.00
Non-Member Price: $193.00
F04300 - SEMI F43 - Test Method for Determination of Particle Contribution by Point-of-Use Gas Purifiers and Gas Filters
SEMI F43 - Test Method for Determination of Particle Contribution by Point-of-Use Gas Purifiers and Gas Filters Sale priceMember Price: $148.00
Non-Member Price: $193.00
F06000 - SEMI F60 - 不動態化した316Lステンレス・スチール部品の接ガス表面の組成をESCAにより評価する試験方法
SEMI F60 - 不動態化した316Lステンレス・スチール部品の接ガス表面の組成をESCAにより評価する試験方法 Sale priceMember Price: $176.00
Non-Member Price: $231.00
E05100 - SEMI E51 - Guide for Typical Facilities Services and Termination Matrix
SEMI E51 - Guide for Typical Facilities Services and Termination Matrix Sale priceMember Price: $148.00
Non-Member Price: $193.00
E13300 - SEMI E133 - Specification for Automated Process Control Systems Interface
SEMI E133 - Specification for Automated Process Control Systems Interface Sale priceMember Price: $148.00
Non-Member Price: $193.00
E12300 - SEMI E123 - Specification for Handler Equipment Specific Equipment Model (HSEM)
SEMI E123 - Specification for Handler Equipment Specific Equipment Model (HSEM) Sale priceMember Price: $148.00
Non-Member Price: $193.00
C08900 - SEMI C89 - Test Method for Particle Removal Performance of Liquid Filter Rated Below 30 nm with Inductively Coupled Plasma – Mass Spectroscopy (ICP-MS)
SEMI C89 - Test Method for Particle Removal Performance of Liquid Filter Rated Below 30 nm with Inductively Coupled Plasma – Mass Spectroscopy (ICP-MS) Sale priceMember Price: $148.00
Non-Member Price: $193.00
T02700 - SEMI T27 - Specification for Traceability Identification Label of Component Parts
SEMI T27 - Specification for Traceability Identification Label of Component Parts Sale priceMember Price: $148.00
Non-Member Price: $193.00
M09300 - SEMI M93 - Test Method for Quantifying Basal Plane Dislocation Density in 4H-SiC by X-Ray Diffraction Topography/Imaging
SEMI M93 - Test Method for Quantifying Basal Plane Dislocation Density in 4H-SiC by X-Ray Diffraction Topography/Imaging Sale priceMember Price: $148.00
Non-Member Price: $193.00
E04500 - SEMI E45 - Test Method for the Determination of Inorganic Contamination from Minienvironments Using VPD-TXRF, VPD-AAS, or VPD/ICP-MS
SEMI E45 - Test Method for the Determination of Inorganic Contamination from Minienvironments Using VPD-TXRF, VPD-AAS, or VPD/ICP-MS Sale priceMember Price: $148.00
Non-Member Price: $193.00
F08200 - SEMI F82 - Specification for Dimension of Mass Flow Controller/Mass Flow Meter for 1.125 Inch Type Surface Mount Gas Distribution Systems
SEMI F82 - Specification for Dimension of Mass Flow Controller/Mass Flow Meter for 1.125 Inch Type Surface Mount Gas Distribution Systems Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF002800 - SEMI MF28 - Test Method for Minority Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductivity Decay
SEMI MF28 - Test Method for Minority Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductivity Decay Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF015400 - SEMI MF154 - Guide for Identification of Structures and Contaminants Seen on Specular Silicon Surfaces
SEMI MF154 - Guide for Identification of Structures and Contaminants Seen on Specular Silicon Surfaces Sale priceMember Price: $148.00
Non-Member Price: $193.00
M08700 - SEMI M87 - Test Method for Contactless Resistivity Measurement of Semi-Insulating Semiconductors
SEMI M87 - Test Method for Contactless Resistivity Measurement of Semi-Insulating Semiconductors Sale priceMember Price: $148.00
Non-Member Price: $193.00