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MF067100 - SEMI MF671 - Test Method for Measuring Flat Length on Wafers of Silicon and Other Electronic Materials
SEMI MF671 - Test Method for Measuring Flat Length on Wafers of Silicon and Other Electronic Materials Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF057600 - SEMI MF576 - Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry
SEMI MF576 - Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF052500 - SEMI MF525 - Test Method for Measuring Resistivity of Silicon Wafers Using a Spreading Resistance Probe
SEMI MF525 - Test Method for Measuring Resistivity of Silicon Wafers Using a Spreading Resistance Probe Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF039700 - SEMI MF397 - Test Method for Resistivity of Silicon Bars Using a Two-Point Probe
SEMI MF397 - Test Method for Resistivity of Silicon Bars Using a Two-Point Probe Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF039100 - SEMI MF391 - Test Method for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage
SEMI MF391 - Test Method for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF037400 - SEMI MF374 - Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure
SEMI MF374 - Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF207400 - SEMI MF2074 - Guide for Measuring Diameter of Silicon and Other Semiconductor Wafers
SEMI MF2074 - Guide for Measuring Diameter of Silicon and Other Semiconductor Wafers Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF180900 - SEMI MF1809 - Guide for Selection and Use of Etching Solutions to Delineate Structural Defects in Silicon
SEMI MF1809 - Guide for Selection and Use of Etching Solutions to Delineate Structural Defects in Silicon Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF177100 - SEMI MF1771 - Test Method for Evaluating Gate Oxide Integrity by Voltage Ramp Technique
SEMI MF1771 - Test Method for Evaluating Gate Oxide Integrity by Voltage Ramp Technique Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF176300 - SEMI MF1763 - Test Method for Measuring Contrast of a Linear Polarizer
SEMI MF1763 - Test Method for Measuring Contrast of a Linear Polarizer Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF172700 - SEMI MF1727 - Practice for Detection of Oxidation Induced Defects in Polished Silicon Wafers
SEMI MF1727 - Practice for Detection of Oxidation Induced Defects in Polished Silicon Wafers Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF172600 - SEMI MF1726 - Practice for Analysis of Crystallographic Perfection of Silicon Wafers
SEMI MF1726 - Practice for Analysis of Crystallographic Perfection of Silicon Wafers Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF161900 - SEMI MF1619 - Test Method for Measurement of Interstitial Oxygen Content of Silicon Wafers by Infrared Absorption Spectroscopy with p-Polarized Radiation Incident at the Brewster Angle
SEMI MF1619 - Test Method for Measurement of Interstitial Oxygen Content of Silicon Wafers by Infrared Absorption Spectroscopy with p-Polarized Radiation Incident at the Brewster Angle Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF156900 - SEMI MF1569 - Guide for Generation of Consensus Reference Materials for Semiconductor Technology
SEMI MF1569 - Guide for Generation of Consensus Reference Materials for Semiconductor Technology Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF153500 - SEMI MF1535 - Test Method for Carrier Recombination Lifetime in Electronic-Grade Silicon Wafers by Noncontact Measurement of Photoconductivity Decay by Microwave Reflectance
SEMI MF1535 - Test Method for Carrier Recombination Lifetime in Electronic-Grade Silicon Wafers by Noncontact Measurement of Photoconductivity Decay by Microwave Reflectance Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF152700 - SEMI MF1527 - Guide for Application of Certified Reference Materials and Reference Wafers for Calibration and Control of Instruments for Measuring Resistivity of Silicon
SEMI MF1527 - Guide for Application of Certified Reference Materials and Reference Wafers for Calibration and Control of Instruments for Measuring Resistivity of Silicon Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF145100 - SEMI MF1451 - Test Method for Measuring Sori on Silicon Wafers by Automated Noncontact Scanning
SEMI MF1451 - Test Method for Measuring Sori on Silicon Wafers by Automated Noncontact Scanning Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF138800 - SEMI MF1388 - Test Method for Generation Lifetime and Generation Velocity of Silicon Material by Capacitance-Time Measurements of Metal-Oxide-Silicon (MOS) Capacitors
SEMI MF1388 - Test Method for Generation Lifetime and Generation Velocity of Silicon Material by Capacitance-Time Measurements of Metal-Oxide-Silicon (MOS) Capacitors Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF123900 - SEMI MF1239 - Test Method for Oxygen Precipitation Characteristics of Silicon Wafers by Measurement of Interstitial Oxygen Reduction
SEMI MF1239 - Test Method for Oxygen Precipitation Characteristics of Silicon Wafers by Measurement of Interstitial Oxygen Reduction Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF118800 - SEMI MF1188 - Test Method for Interstitial Oxygen Content of Silicon by Infrared Absorption With Short Baseline
SEMI MF1188 - Test Method for Interstitial Oxygen Content of Silicon by Infrared Absorption With Short Baseline Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF115200 - SEMI MF1152 - Test Method for Dimensions of Notches on Silicon Wafers
SEMI MF1152 - Test Method for Dimensions of Notches on Silicon Wafers Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF104900 - SEMI MF1049 - Practice for Shallow Etch Pit Detection on Silicon Wafers
SEMI MF1049 - Practice for Shallow Etch Pit Detection on Silicon Wafers Sale priceMember Price: $148.00
Non-Member Price: $193.00
ME139200 - SEMI ME1392 - Guide for Angle Resolved Optical Scatter Measurements on Specular or Diffuse Surfaces
SEMI ME1392 - Guide for Angle Resolved Optical Scatter Measurements on Specular or Diffuse Surfaces Sale priceMember Price: $148.00
Non-Member Price: $193.00
M08800 - SEMI M88 - Practice for Sample Preparation Methods for Measuring Minority Carrier Diffusion Length in Silicon Wafers by Surface Photovoltage Methods
SEMI M88 - Practice for Sample Preparation Methods for Measuring Minority Carrier Diffusion Length in Silicon Wafers by Surface Photovoltage Methods Sale priceMember Price: $148.00
Non-Member Price: $193.00