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Electronic Design Market Data (EDMD) - Single Edition
Electronic Design Market Data (EDMD) Single Edition Sale priceMember Price: $3,300.00
Non-Member Price: $5,200.00
F11500 - SEMI F115 - Test Method for the Determination of Metallic Elements Present on Wetted Surfaces of Ultra High Purity Chemical Delivery Systems and Components
SEMI F115 - Test Method for the Determination of Metallic Elements Present on Wetted Surfaces of Ultra High Purity Chemical Delivery Systems and Components Sale priceMember Price: $148.00
Non-Member Price: $193.00
M00100 - SEMI M1 - 鏡面単結晶シリコンウェーハの仕様
SEMI M1 - 鏡面単結晶シリコンウェーハの仕様 Sale priceMember Price: $344.00
Non-Member Price: $457.00
E03700 - SEMI E37 - HSMS의 일반적 서비스(HIGH-SPEED SECS MESSAGE SERVICES (HSMS) GENERIC SERVICES)
SEMI E37 - HSMS의 일반적 서비스(HIGH-SPEED SECS MESSAGE SERVICES (HSMS) GENERIC SERVICES) Sale priceMember Price: $148.00
Non-Member Price: $193.00
E00109 - SEMI E1.9 - Mechanical Specification for Cassettes Used to Transport and Store 300 mm Wafers
SEMI E1.9 - Mechanical Specification for Cassettes Used to Transport and Store 300 mm Wafers Sale priceMember Price: $148.00
Non-Member Price: $193.00
T00300 - SEMI T3 - Specification for Wafer Box LabelsT00300 - SEMI T3 - Specification for Wafer Box Labels
SEMI T3 - Specification for Wafer Box Labels Sale priceMember Price: $148.00
Non-Member Price: $193.00
S02600 - SEMI S26 - Environmental, Health, and Safety Guideline for FPD Manufacturing System
SEMI S26 - Environmental, Health, and Safety Guideline for FPD Manufacturing System Sale priceMember Price: $148.00
Non-Member Price: $193.00
PV02200 - SEMI PV22 - Specification for Silicon Wafers for Use in Photovoltaic Solar Cells
SEMI PV22 - Specification for Silicon Wafers for Use in Photovoltaic Solar Cells Sale priceMember Price: $148.00
Non-Member Price: $193.00
P00500 - SEMI P5 - Specification for Pellicles
SEMI P5 - Specification for Pellicles Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF008400 - SEMI MF84 - Test Method for Measuring Resistivity of Silicon Wafers With an In-Line Four-Point Probe
SEMI MF84 - Test Method for Measuring Resistivity of Silicon Wafers With an In-Line Four-Point Probe Sale priceMember Price: $148.00
Non-Member Price: $193.00
MF004300 - SEMI MF43 - Test Method for Resistivity of Semiconductor Materials
SEMI MF43 - Test Method for Resistivity of Semiconductor Materials Sale priceMember Price: $148.00
Non-Member Price: $193.00
M07300 - SEMI M73 - Test Method for Extracting Relevant Characteristics from Measured Wafer Edge Profiles
SEMI M73 - Test Method for Extracting Relevant Characteristics from Measured Wafer Edge Profiles Sale priceMember Price: $148.00
Non-Member Price: $193.00
M04000 - SEMI M40 - Guide for Measurement of Roughness of Planar Surfaces on Polished Wafers
SEMI M40 - Guide for Measurement of Roughness of Planar Surfaces on Polished Wafers Sale priceMember Price: $148.00
Non-Member Price: $193.00
G08100 - SEMI G81 - Specification for Map Data Items
SEMI G81 - Specification for Map Data Items Sale priceMember Price: $148.00
Non-Member Price: $193.00
E05600 - SEMI E56 - Test Method for Determining Accuracy, Linearity, Repeatability, Short-Term Reproducibility, Hysteresis, and Deadband of Thermal Mass Flow Controllers
SEMI E56 - Test Method for Determining Accuracy, Linearity, Repeatability, Short-Term Reproducibility, Hysteresis, and Deadband of Thermal Mass Flow Controllers Sale priceMember Price: $148.00
Non-Member Price: $193.00
E00500 - SEMI E5 - 半導体製造装置通信スタンダード2 メッセージ内容（SECS-II）
SEMI E5 - 半導体製造装置通信スタンダード2 メッセージ内容（SECS-II） Sale priceMember Price: $344.00
Non-Member Price: $457.00
E01900 - SEMI E19 - Specification for Standard Mechanical Interface (SMIF)
SEMI E19 - Specification for Standard Mechanical Interface (SMIF) Sale priceMember Price: $148.00
Non-Member Price: $193.00
E16900 - SEMI E169 - 装置情報システムセキュリテイのためのガイド
SEMI E169 - 装置情報システムセキュリテイのためのガイド Sale priceMember Price: $176.00
Non-Member Price: $231.00
Semiconductor Basics
Semiconductor Basics Sale priceMember Price: $180.00
Non-Member Price: $200.00
P04700 - SEMI P47 - Test Method for Evaluation of Line-Edge Roughness and Linewidth Roughness
SEMI P47 - Test Method for Evaluation of Line-Edge Roughness and Linewidth Roughness Sale priceMember Price: $148.00
Non-Member Price: $193.00
E01000 - SEMI E10 - 半導体製造装置の信頼性，有用性，整備性（RAM），利用性の定義と測定のための仕様
SEMI E10 - 半導体製造装置の信頼性，有用性，整備性（RAM），利用性の定義と測定のための仕様 Sale priceMember Price: $176.00
Non-Member Price: $231.00
S01500 - SEMI S15 - Safety Guideline for the Evaluation of Toxic and Flammable Gas Detection Systems
SEMI S15 - Safety Guideline for the Evaluation of Toxic and Flammable Gas Detection Systems Sale priceMember Price: $148.00
Non-Member Price: $193.00
S01000 - SEMI S10 - 위험성 평가 및 위험성 검토 절차 안전 가이드라인
SEMI S10 - 위험성 평가 및 위험성 검토 절차 안전 가이드라인 Sale priceMember Price: $148.00
Non-Member Price: $193.00
E10100 - SEMI E101 - Guide for EFEM Functional Structure Model
SEMI E101 - Guide for EFEM Functional Structure Model Sale priceMember Price: $148.00
Non-Member Price: $193.00