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F00700 - SEMI F7 - Test Method to Determine the Tensile Strength of Tube Fitting Connections Made of Fluorocarbon Materials
SEMI F7 - Test Method to Determine the Tensile Strength of Tube Fitting Connections Made of Fluorocarbon Materials Sale priceMember Price: $144.00
Non-Member Price: $187.00
F05200 - SEMI F52 - Dimensional Specification for Metric PFA Tubes for Semiconductor and Flat Panel Display Manufacturing
SEMI F52 - Dimensional Specification for Metric PFA Tubes for Semiconductor and Flat Panel Display Manufacturing Sale priceMember Price: $144.00
Non-Member Price: $187.00
F02700 - SEMI F27 - Test Method for Moisture Interaction and Content of Gas Distribution Systems and Components by Atmospheric Pressure Ionization Mass Spectrometry (APIMS)
SEMI F27 - Test Method for Moisture Interaction and Content of Gas Distribution Systems and Components by Atmospheric Pressure Ionization Mass Spectrometry (APIMS) Sale priceMember Price: $144.00
Non-Member Price: $187.00
F01100 - SEMI F11 - Test Method to Obtain an Indication of the Thermal Characteristics of Tube Fitting Connections Made of Fluorocarbon Materials
SEMI F11 - Test Method to Obtain an Indication of the Thermal Characteristics of Tube Fitting Connections Made of Fluorocarbon Materials Regular price$300.00 USD Sale price$187.00 USD
E08100 - SEMI E81 - Provisional Specification for CIM Framework Domain Architecture
SEMI E81 - Provisional Specification for CIM Framework Domain Architecture Sale priceMember Price: $144.00
Non-Member Price: $187.00
E06400 - SEMI E64 - Specification for 300 mm Cart to SEMI E15.1 Docking Interface Port
SEMI E64 - Specification for 300 mm Cart to SEMI E15.1 Docking Interface Port Sale priceMember Price: $144.00
Non-Member Price: $187.00
E05300 - SEMI E53 - Event Reporting
SEMI E53 - Event Reporting Sale priceMember Price: $144.00
Non-Member Price: $187.00
E04701 - SEMI E47.1 - 300 mmウェーハ搬送および保管用FOUPの機械仕様
SEMI E47.1 - 300 mmウェーハ搬送および保管用FOUPの機械仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
E04600 - SEMI E46 - Test Method for the Determination of Organic Contamination from Minienvironments Using Ion Mobility Spectrometry (IMS)
SEMI E46 - Test Method for the Determination of Organic Contamination from Minienvironments Using Ion Mobility Spectrometry (IMS) Sale priceMember Price: $144.00
Non-Member Price: $187.00
E03200 - SEMI E32 - Material Movement Management (MMM)
SEMI E32 - Material Movement Management (MMM) Sale priceMember Price: $144.00
Non-Member Price: $187.00
T00900 - SEMI T9 - Specification for Marking of Metal Lead-Frame Strips with a Two-Dimensional Data Matrix Code Symbol
SEMI T9 - Specification for Marking of Metal Lead-Frame Strips with a Two-Dimensional Data Matrix Code Symbol Sale priceMember Price: $144.00
Non-Member Price: $187.00
S01700 - SEMI S17 - 無人搬運車（UTV）系統之安全基準
SEMI S17 - 無人搬運車（UTV）系統之安全基準 Sale priceMember Price: $144.00
Non-Member Price: $187.00
S01700 - SEMI S17 - 無人搬送台車（UTV）システムの安全ガイドライン
SEMI S17 - 無人搬送台車（UTV）システムの安全ガイドライン Sale priceMember Price: $171.00
Non-Member Price: $224.00
PV07600 - SEMI PV76 - Test Method for Durability of Low Light Intensity Organic Photovoltaic (OPV) and Dye-Sensitized Solar Cell (DSSC) and Perovskite Solar Cell (PSC)
SEMI PV76 - Test Method for Durability of Low Light Intensity Organic Photovoltaic (OPV) and Dye-Sensitized Solar Cell (DSSC) and Perovskite Solar Cell (PSC) Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV07500 - SEMI PV75 - Test Method on Cell Level for Potential-Induced Degradation Susceptibility of Solar Cells and Module Encapsulation Materials
SEMI PV75 - Test Method on Cell Level for Potential-Induced Degradation Susceptibility of Solar Cells and Module Encapsulation Materials Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV05400 - SEMI PV54 - Specification for Silver Paste, Used to Contact with N+ Diffusion Layer of Crystalline Silicon Solar Cells
SEMI PV54 - Specification for Silver Paste, Used to Contact with N+ Diffusion Layer of Crystalline Silicon Solar Cells Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV05100 - SEMI PV51 - Test Method for In-Line Characterization of Photovoltaic Silicon Wafers by Using Photoluminescence
SEMI PV51 - Test Method for In-Line Characterization of Photovoltaic Silicon Wafers by Using Photoluminescence Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF009500 - SEMI MF95 - Test Method for Thickness of Lightly Doped Silicon Epitaxial Layers on Heavily Doped Silicon Substrates Using an Infrared Dispersive Spectrophotometer
SEMI MF95 - Test Method for Thickness of Lightly Doped Silicon Epitaxial Layers on Heavily Doped Silicon Substrates Using an Infrared Dispersive Spectrophotometer Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF053300 - SEMI MF533 - Test Method for Thickness and Thickness Variation of Silicon Wafers
SEMI MF533 - Test Method for Thickness and Thickness Variation of Silicon Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF037400 - SEMI MF374 - Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure
SEMI MF374 - Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF213900 - SEMI MF2139 - Test Method for Measuring Nitrogen Concentration in Silicon Substrates by Secondary Ion Mass Spectrometry
SEMI MF2139 - Test Method for Measuring Nitrogen Concentration in Silicon Substrates by Secondary Ion Mass Spectrometry Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF163000 - SEMI MF1630 - Test Method for Low Temperature FT-IR Analysis of Single Crystal Silicon for III-V Impurities
SEMI MF1630 - Test Method for Low Temperature FT-IR Analysis of Single Crystal Silicon for III-V Impurities Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF139200 - SEMI MF1392 - Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements with a Mercury Probe
SEMI MF1392 - Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements with a Mercury Probe Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF138900 - SEMI MF1389 - Test Method for Photoluminescence Analysis of Single Crystal Silicon for III-V Impurities
SEMI MF1389 - Test Method for Photoluminescence Analysis of Single Crystal Silicon for III-V Impurities Sale priceMember Price: $144.00
Non-Member Price: $187.00