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E17200 - SEMI E172 - Specification for SECS Equipment Data Dictionary (SEDD)
SEMI E172 - Specification for SECS Equipment Data Dictionary (SEDD) Sale price Member Price : $144.00
E01600 - SEMI E16 - Guide for Determining and Describing Mass Flow Controller Leak Rates
SEMI E16 - Guide for Determining and Describing Mass Flow Controller Leak Rates Sale priceMember Price: $144.00
Non-Member Price: $187.00
E15800 - SEMI E158 - Specification for Mechanical Features of Fab Wafer Carrier Used to Transport and Store 450 mm Wafers (450 FOUP) and Kinematic Coupling
SEMI E158 - Specification for Mechanical Features of Fab Wafer Carrier Used to Transport and Store 450 mm Wafers (450 FOUP) and Kinematic Coupling Regular price$300.00 USD Sale price$187.00 USD
E15400 - SEMI E154 - Specification for Mechanical Features of 450 mm Load Port
SEMI E154 - Specification for Mechanical Features of 450 mm Load Port Regular price$300.00 USD Sale price$187.00 USD
E11300 - SEMI E113 - Specification for Semiconductor Processing Equipment RF Power Delivery Systems
SEMI E113 - Specification for Semiconductor Processing Equipment RF Power Delivery Systems Sale priceMember Price: $144.00
Non-Member Price: $187.00
E11100 - SEMI E111 - Specification for a 150 mm Reticle SMIF Pod (RSP150) Used to Transport and Store a 6 Inch Reticle
SEMI E111 - Specification for a 150 mm Reticle SMIF Pod (RSP150) Used to Transport and Store a 6 Inch Reticle Sale priceMember Price: $144.00
Non-Member Price: $187.00
D07800 - SEMI D78 - Test Method of Water Vapor Barrier Property for Plastic Films with High Gas Barrier for Electronic Devices
SEMI D78 - Test Method of Water Vapor Barrier Property for Plastic Films with High Gas Barrier for Electronic Devices Sale priceMember Price: $144.00
Non-Member Price: $187.00
D07500 - SEMI D75 - Test Method for Color Reproduction and Perceptual Contrast of Display
SEMI D75 - Test Method for Color Reproduction and Perceptual Contrast of Display Sale priceMember Price: $144.00
Non-Member Price: $187.00
D05700 - SEMI D57 - Guide for Definition of Measurement Index Visual Contrast Threshold (VCT) for Mura in FPD Image Quality Inspection
SEMI D57 - Guide for Definition of Measurement Index Visual Contrast Threshold (VCT) for Mura in FPD Image Quality Inspection Sale priceMember Price: $144.00
Non-Member Price: $187.00
C00605 - SEMI C6.5 - Particle Specification for Grade 10/0.2 Nitrogen (N2) and Argon (Ar) Delivered as Pipeline Gas
SEMI C6.5 - Particle Specification for Grade 10/0.2 Nitrogen (N2) and Argon (Ar) Delivered as Pipeline Gas Sale priceMember Price: $144.00
Non-Member Price: $187.00
C00348 - SEMI C3.48 - Standard for Nitrogen (N2), Bulk Liquid, 99.9994% Quality
SEMI C3.48 - Standard for Nitrogen (N2), Bulk Liquid, 99.9994% Quality Sale priceMember Price: $144.00
Non-Member Price: $187.00
C00200 - SEMI C2 - Specifications for Etchants
SEMI C2 - Specifications for Etchants Sale priceMember Price: $144.00
Non-Member Price: $187.00
C00604 - SEMI C6.4 - Particle Specification for Grade 20/0.02 Nitrogen (N2) and Argon (Ar) Delivered as Pipeline Gas
SEMI C6.4 - Particle Specification for Grade 20/0.02 Nitrogen (N2) and Argon (Ar) Delivered as Pipeline Gas Sale priceMember Price: $144.00
Non-Member Price: $187.00
C00331 - SEMI C3.31 - Specification for Dichlorosilane (SiH2Cl2) in Cylinders, 99% Quality (Provisional)
SEMI C3.31 - Specification for Dichlorosilane (SiH2Cl2) in Cylinders, 99% Quality (Provisional) Sale priceMember Price: $144.00
Non-Member Price: $187.00
C00330 - SEMI C3.30 - Standard for Hydrogen (H2), Bulk, 99.9997% Quality
SEMI C3.30 - Standard for Hydrogen (H2), Bulk, 99.9997% Quality Sale priceMember Price: $144.00
Non-Member Price: $187.00
C09600 - SEMI C96 - Test Method for Determining Density of Chemical Mechanical Planarization (CMP) Slurries
SEMI C96 - Test Method for Determining Density of Chemical Mechanical Planarization (CMP) Slurries Sale priceMember Price: $144.00
Non-Member Price: $187.00
C09100 - SEMI C91 - Test Method for Determination of Moisture Dry-Down Characteristics of Gas Delivery Components
SEMI C91 - Test Method for Determination of Moisture Dry-Down Characteristics of Gas Delivery Components Sale priceMember Price: $144.00
Non-Member Price: $187.00
C08200 - SEMI C82 - Test Method for Particle Removal Performance of Liquid Filter Rated 20 to 50 nm With Liquid-Borne Particle Counter
SEMI C82 - Test Method for Particle Removal Performance of Liquid Filter Rated 20 to 50 nm With Liquid-Borne Particle Counter Sale priceMember Price: $144.00
Non-Member Price: $187.00
C08100 - SEMI C81 - Guide for Tris(Dimethylamino) Silane (3DMAS)
SEMI C81 - Guide for Tris(Dimethylamino) Silane (3DMAS) Sale priceMember Price: $144.00
Non-Member Price: $187.00
C06600 - SEMI C66 - Guide for Trimethylaluminium (TMAI), 99.5% Quality
SEMI C66 - Guide for Trimethylaluminium (TMAI), 99.5% Quality Sale priceMember Price: $144.00
Non-Member Price: $187.00
C03100 - SEMI C31 - Specification for Methanol
SEMI C31 - Specification for Methanol Sale priceMember Price: $144.00
Non-Member Price: $187.00
C00356 - SEMI C3.56 - Specification for Diborane Mixtures
SEMI C3.56 - Specification for Diborane Mixtures Sale priceMember Price: $144.00
Non-Member Price: $187.00
3D00500 - SEMI 3D5 - Guide for Metrology Techniques to be Used in Measurement of Geometrical Parameters of Through-Silicon Vias (TSVs) in 3DS-IC Structures
SEMI 3D5 - Guide for Metrology Techniques to be Used in Measurement of Geometrical Parameters of Through-Silicon Vias (TSVs) in 3DS-IC Structures Sale priceMember Price: $144.00
Non-Member Price: $187.00
E19400 - SEMI E194 - Guide to Using a Liquid Particle Counter to Assess Particulate Surface Contamination on Critical Chamber Components and Coupons
SEMI E194 - Guide to Using a Liquid Particle Counter to Assess Particulate Surface Contamination on Critical Chamber Components and Coupons Sale priceMember Price: $144.00
Non-Member Price: $187.00