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G07900 - SEMI G79 - Specification for Overall Digital Timing Accuracy
SEMI G79 - Specification for Overall Digital Timing Accuracy Sale priceMember Price: $144.00
Non-Member Price: $187.00
G05800 - SEMI G58 - Specification for Cerquad Package Constructions
SEMI G58 - Specification for Cerquad Package Constructions Sale priceMember Price: $144.00
Non-Member Price: $187.00
C04100 - SEMI C41 - 2-プロパノールの仕様とガイドライン
SEMI C41 - 2-プロパノールの仕様とガイドライン Sale priceMember Price: $171.00
Non-Member Price: $224.00
C03800 - SEMI C38 - Guide for Phosphorus Oxychloride
SEMI C38 - Guide for Phosphorus Oxychloride Sale priceMember Price: $144.00
Non-Member Price: $187.00
C00100 - SEMI C1 - 液体化学薬品の分析のためのガイド
SEMI C1 - 液体化学薬品の分析のためのガイド Sale priceMember Price: $171.00
Non-Member Price: $224.00
P04200 - SEMI P42 - Specification of Reticle Data for Automatic Recipe Transfer to Wafer Exposure System
P03400 - SEMI P34 - Specification for 230 mm Square Photomask Substrates
SEMI P34 - Specification for 230 mm Square Photomask Substrates Sale priceMember Price: $144.00
Non-Member Price: $187.00
P03200 - SEMI P32 - Test Method for Determination of Trace Metals in Photoresist
SEMI P32 - Test Method for Determination of Trace Metals in Photoresist Sale priceMember Price: $144.00
Non-Member Price: $187.00
P02800 - SEMI P28 - Specification for Overlay-Metrology Test Patterns for Integrated-Circuit Manufacture
P02600 - SEMI P26 - Parameter Checklist for Photoresist Sensitivity Measurement
SEMI P26 - Parameter Checklist for Photoresist Sensitivity Measurement Sale priceMember Price: $144.00
Non-Member Price: $187.00
P02100 - SEMI P21 - Guidelines for Precision and Accuracy Expression for Mask Writing Equipment
SEMI P21 - Guidelines for Precision and Accuracy Expression for Mask Writing Equipment Sale priceMember Price: $144.00
Non-Member Price: $187.00
P01900 - SEMI P19 - Specification for Metrology Pattern Cells for Integrated Circuit Manufacture
P01800 - SEMI P18 - Specification for Overlay Capabilities of Wafer Steppers
SEMI P18 - Specification for Overlay Capabilities of Wafer Steppers Sale priceMember Price: $144.00
Non-Member Price: $187.00
G08400 - SEMI G84 - Specification for Strip Map Protocol
SEMI G84 - Specification for Strip Map Protocol Sale priceMember Price: $144.00
Non-Member Price: $187.00
F07100 - SEMI F71 - ガス供給システムの温度サイクル試験方法
SEMI F71 - ガス供給システムの温度サイクル試験方法 Regular price$300.00 USD Sale price$224.00 USD
F04000 - SEMI F42 - Test Method for Semiconductor Processing Equipment Voltage Sag Immunity
SEMI F42 - Test Method for Semiconductor Processing Equipment Voltage Sag Immunity Sale priceMember Price: $144.00
Non-Member Price: $187.00
F07700 - SEMI F77 - 腐食性のガスシステムに使用される合金表面の電気化学的臨界孔食温度のテスト方法
F03700 - SEMI F37 - ガス供給システム構成部品の表面粗さパラメータの算出方法
F02900 - SEMI F29 - ガスソースシステムパネルのパージ効果のテスト方法
SEMI F29 - ガスソースシステムパネルのパージ効果のテスト方法 Sale priceMember Price: $171.00
Non-Member Price: $224.00
M05200 - SEMI M52 - 130 nm,90nm,65nmおよび45nm技術世代シリコンウェーハ用走査型表面検査装置仕様のためのガイド
M03900 - SEMI M39 - Test Method for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Semi-Insulating GaAs Single Crystals
M03200 - SEMI M32 - Guide to Statistical Specifications
SEMI M32 - Guide to Statistical Specifications Sale priceMember Price: $144.00
Non-Member Price: $187.00
M00300 - SEMI M3 - Specifications for Polished Monocrystalline Sapphire Substrates
SEMI M3 - Specifications for Polished Monocrystalline Sapphire Substrates Sale priceMember Price: $144.00
Non-Member Price: $187.00
M02000 - SEMI M20 - ウェーハ座標システムの確立の作業方法
SEMI M20 - ウェーハ座標システムの確立の作業方法 Sale priceMember Price: $171.00
Non-Member Price: $224.00