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E19200 - SEMI E192 - Guide for Equipment Adoption Criteria for GEM and GEM-related Standards
SEMI E192 - Guide for Equipment Adoption Criteria for GEM and GEM-related Standards Sale priceMember Price: $144.00
Non-Member Price: $187.00
F12200 - SEMI F122 - Guide for Facilities Data Package for Manufacturing Equipment Installation and Building Information Modeling
SEMI F122 - Guide for Facilities Data Package for Manufacturing Equipment Installation and Building Information Modeling Sale priceMember Price: $144.00
Non-Member Price: $187.00
FH00400 - SEMI FH4 - Test Method and Guide for the Tactile Characteristics of Flexible Hybrid Electronics Materials and Products
SEMI FH4 - Test Method and Guide for the Tactile Characteristics of Flexible Hybrid Electronics Materials and Products Sale priceFrom $187.00 USD
D08600 - SEMI D86 - Test Method of Flicker Nuisance for Wide-Visual-Field Displays
SEMI D86 - Test Method of Flicker Nuisance for Wide-Visual-Field Displays Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV10100 - SEMI PV101 - Guide for Scrap Judgement of Photovoltaic Modules in Building
SEMI PV101 - Guide for Scrap Judgement of Photovoltaic Modules in Building Sale priceMember Price: $144.00
Non-Member Price: $187.00
FH00200 - SEMI FH2 - Test Method of Sheet Resistance for Woven Electronic Textiles
SEMI FH2 - Test Method of Sheet Resistance for Woven Electronic Textiles Sale priceMember Price: $144.00
Non-Member Price: $187.00
FH00100 - SEMI FH1 - Test Method of Line Impedance for Electronic Textiles
SEMI FH1 - Test Method of Line Impedance for Electronic Textiles Sale priceMember Price: $144.00
Non-Member Price: $187.00
T02400 - SEMI T24 - Specification for ID Marking for Glass Carrier Characteristics of Panel Level Packaging (PLP) Applications
SEMI T24 - Specification for ID Marking for Glass Carrier Characteristics of Panel Level Packaging (PLP) Applications Sale priceMember Price: $144.00
Non-Member Price: $187.00
G10200 - SEMI G102 - Specification for Shear Strength of Encapsulation Materials for Wafer Level Packaging and Panel Level Packaging
SEMI G102 - Specification for Shear Strength of Encapsulation Materials for Wafer Level Packaging and Panel Level Packaging Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV07300 - SEMI PV73 - Test Method for Thin-Film Silicon Photovoltaic (PV) Modules Light Soaking
SEMI PV73 - Test Method for Thin-Film Silicon Photovoltaic (PV) Modules Light Soaking Sale priceMember Price: $144.00
Non-Member Price: $187.00
F11700 - SEMI F117 - Specification for Dimensions of Sandwich Components for 1.125 Inch Type Surface Mount Gas Distribution Systems
SEMI F117 - Specification for Dimensions of Sandwich Components for 1.125 Inch Type Surface Mount Gas Distribution Systems Sale priceMember Price: $144.00
Non-Member Price: $187.00
C10200 - SEMI C102 - Guide for Reporting Density and Porosity of Chemical Mechanical Planarization (CMP) Polishing Pads Used in Semiconductor Manufacturing
SEMI C102 - Guide for Reporting Density and Porosity of Chemical Mechanical Planarization (CMP) Polishing Pads Used in Semiconductor Manufacturing Sale priceMember Price: $144.00
Non-Member Price: $187.00
D07900 - SEMI D79 - Test Method for Local and Overall Flicker of Flexible Displays
SEMI D79 - Test Method for Local and Overall Flicker of Flexible Displays Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV09800 - SEMI PV99 - Classification of Building Integrated Photovoltaic (BIPV)
SEMI PV99 - Classification of Building Integrated Photovoltaic (BIPV) Sale priceMember Price: $144.00
Non-Member Price: $187.00
C10000 - SEMI C100 - Guide for Reporting Chemical Mechanical Planarization (CMP) Polishing Pads Hardness Used in Semiconductor Manufacturing
SEMI C100 - Guide for Reporting Chemical Mechanical Planarization (CMP) Polishing Pads Hardness Used in Semiconductor Manufacturing Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV09300 - SEMI PV93 - Test Method for Accelerated Cell Level Testing for Light And Elevated Temperature Induced Degradation (LeTID) Susceptibility of Solar Cells
SEMI PV93 - Test Method for Accelerated Cell Level Testing for Light And Elevated Temperature Induced Degradation (LeTID) Susceptibility of Solar Cells Sale priceMember Price: $144.00
Non-Member Price: $187.00
C09900 - SEMI C99 - Test Method for Determining Conductivity of Chemical Mechanical Planarization (CMP) Slurries and Related Chemicals
SEMI C99 - Test Method for Determining Conductivity of Chemical Mechanical Planarization (CMP) Slurries and Related Chemicals Sale priceMember Price: $144.00
Non-Member Price: $187.00
PV09100 - SEMI PV91 - Specification for Trichlorosilane Used in Polysilicon Production
SEMI PV91 - Specification for Trichlorosilane Used in Polysilicon Production Sale priceMember Price: $144.00
Non-Member Price: $187.00
T01000 - SEMI T10 - 二次元データマトリクス直接マーク品質を評価する試験方法
SEMI T10 - 二次元データマトリクス直接マーク品質を評価する試験方法 Sale priceMember Price: $171.00
Non-Member Price: $224.00
P04400 - SEMI P44 - マスク装置向けオープン・アートワーク・システム・インターチェンジ・スタンダード（OASIS®）の仕様
SEMI P44 - マスク装置向けオープン・アートワーク・システム・インターチェンジ・スタンダード（OASIS®）の仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
D03100 - SEMI D31 - FPD画質検査における輝度ムラの計量単位（DSEMU）の定義
SEMI D31 - FPD画質検査における輝度ムラの計量単位（DSEMU）の定義 Sale priceMember Price: $171.00
Non-Member Price: $224.00
G06700 - SEMI G67 - シート材料から発生する粒子の測定の試験方法
SEMI G67 - シート材料から発生する粒子の測定の試験方法 Sale priceMember Price: $171.00
Non-Member Price: $224.00
G08100 - SEMI G81 - マップデータ・アイテムの仕様
SEMI G81 - マップデータ・アイテムの仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
G08500 - SEMI G85 - マップデータ・フォーマット用仕様
SEMI G85 - マップデータ・フォーマット用仕様 Sale price Member Price : $171.00