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MS01300 - SEMI MS13 - Guide for Use of Test Patterns for Characterizing a Deep Reactive Ion Etching (DRIE) Process
PV09400 - SEMI PV94 - Guide for Identifying Cell Defects In Crystalline Silicon Photovoltaic (PV) Modules By Electroluminescence (EL) Imaging
3D02100 - SEMI 3D21 - Guide for Describing Glass-Based Material for Use in 3DS-IC Process
SEMI 3D21 - Guide for Describing Glass-Based Material for Use in 3DS-IC Process Sale priceMember Price: $144.00
Non-Member Price: $187.00
G00500 - SEMI G5 - Standard for Ceramic Chip Carriers
SEMI G5 - Standard for Ceramic Chip Carriers Sale priceMember Price: $144.00
Non-Member Price: $187.00
T00700 - SEMI T7 - 二次元マトリクスコードシンボルの両面研磨ウェーハ裏面マーキングの仕様
P04500 - SEMI P45 - マスク装置向けジョブデック・データフォーマットの仕様
G08000 - SEMI G80 - Test Method for the Analysis of Overall Digital Timing Accuracy for Automated Test Equipment
C00300 - SEMI C3 - ガスの仕様
SEMI C3 - ガスの仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
P04300 - SEMI P43 - Photomask Qualification Terminology
SEMI P43 - Photomask Qualification Terminology Sale priceMember Price: $144.00
Non-Member Price: $187.00
P04100 - SEMI P41 - Specification for Mask Defect Data Handling with XML, Between Defect Inspection Tools, Repair Tools, and Review Tools
P03500 - SEMI P35 - Terminology for Microlithography Metrology
SEMI P35 - Terminology for Microlithography Metrology Sale priceMember Price: $144.00
Non-Member Price: $187.00
F09800 - SEMI F98 - 半導体プロセスにおける用水再処理のためのガイド
SEMI F98 - 半導体プロセスにおける用水再処理のためのガイド Sale priceMember Price: $171.00
Non-Member Price: $224.00
F02000 - SEMI F20 - 高純度および超高純度の半導体製造アプリケーションで使用される汎用コンポーネント用の316Lステンレス鋼の棒鋼,鍛造品,押出成形品,鋼板,鋼管の仕様
MF172300 - SEMI MF1723 - Practice for Evaluation of Polycrystalline Silicon Rods by Float-Zone Crystal Growth and Spectroscopy
M07300 - SEMI M73 - 測定したウェーハエッジプロファイルから直接的関連性ある特性を抽出するテスト方法
E05200 - SEMI E52 - Practice for Referencing Gases, Gas Mixtures, and Vaporizable Materials Used in Digital Mass Flow Controllers
E04900 - SEMI E49 - 高純度および超高純度配管システムの性能,サブアセンブリ,最終組立のためのガイド
E03500 - SEMI E35 - 半導体製造装置のCOO測定方法の計算ガイド
SEMI E35 - 半導体製造装置のCOO測定方法の計算ガイド Sale priceMember Price: $171.00
Non-Member Price: $224.00
S02800 - SEMI S28 - 半導体製造装置用ロボットおよびロードポートの安全ガイドライン
S02700 - SEMI S27 - Safety Guideline for the Contents of Environmental, Safety, and Health (ESH) Evaluation Reports
S02400 - SEMI S24 - Safety Guideline for Multi-Employer Work Areas
SEMI S24 - Safety Guideline for Multi-Employer Work Areas Sale priceMember Price: $144.00
Non-Member Price: $187.00
S01800 - SEMI S18 - 矽烷族氣體處理之安全衛生及環保基準
SEMI S18 - 矽烷族氣體處理之安全衛生及環保基準 Sale priceMember Price: $144.00
Non-Member Price: $187.00
S01200 - SEMI S12 - 設備除污基準
SEMI S12 - 設備除污基準 Sale priceMember Price: $144.00
Non-Member Price: $187.00
F00800 - SEMI F8 - Test Method for Evaluating the Sealing Capabilities of Tube Fitting Connections Made of Fluorocarbon Materials, When Subjected to Tensile Forces