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F02000 - SEMI F20 - 用于通用、高纯和超高纯半导体制造组件的316L不锈钢棒材、锻材、挤压型材、板材和管材的规范
E18700 - SEMI E187 - Specification for Cybersecurity of Fab Equipment
SEMI E187 - Specification for Cybersecurity of Fab Equipment Sale priceMember Price: $286.00
Non-Member Price: $380.00
E04400 - SEMI E44 - Guide for Procurment and Acceptance of Minienvironments
SEMI E44 - Guide for Procurment and Acceptance of Minienvironments Sale priceMember Price: $148.00
Non-Member Price: $193.00
E18500 - SEMI E185 - Specification for 300 mm Tape Frame FOUP
SEMI E185 - Specification for 300 mm Tape Frame FOUP Sale priceMember Price: $148.00
Non-Member Price: $193.00
E18400 - SEMI E184 - Specification for 300 mm Tape Frame FOUP Load Port
SEMI E184 - Specification for 300 mm Tape Frame FOUP Load Port Sale priceMember Price: $148.00
Non-Member Price: $193.00
Flex Electronics Webinar Master Class Series: Batteries, AI, HI, Materials, Applications, Sustainability (On Demand 2021)
F11900 - SEMI F119 - Test Method for Determining the Critical Pitting Temperature of Stainless Steel Surfaces Used in Corrosive Gas Systems by Use of a Ferric Chloride Solution
F11800 - SEMI F118 - Test Method for Determination of Moisture Dry-Down Characteristics of Gas Delivery Components
F11700 - SEMI F117 - Specification for Dimensions of Sandwich Components for 1.125 Inch Type Surface Mount Gas Distribution Systems
Flex Electronics Webinar Master Class: December 2021 (On Demand)
Flex Electronics Webinar Master Class: December 2021 (On Demand) Sale priceMember Price: $49.00
Non-Member Price: $99.00
E18600 - SEMI E186 - Specification for Location and Dimensions for Power Connectors and Ethercat Ports in Mass Flow Controllers and Mass Flow Meters
E18300 - SEMI E183 - Specification for Rich Interactive Test Database (RITdb)
SEMI E183 - Specification for Rich Interactive Test Database (RITdb) Sale priceMember Price: $148.00
Non-Member Price: $193.00
C10300 - SEMI C103 - Guide for Reporting Performance Parameters of the Chemical Mechanical Planarization (CMP) Conditioning Disks Used in Semiconductor Manufacturing
Flex Electronics Webinar Master Class: October 2021 (on demand)
Flex Electronics Webinar Master Class: October 2021 (on demand) Sale priceMember Price: $49.00
Non-Member Price: $99.00
PV05000 - SEMI PV50 - Specification for Impurities in Polyethylene Packaging Materials for Polysilicon Feedstock
Flex Electronics Webinar Master Class: September 2021 (On Demand)
Flex Electronics Webinar Master Class: September 2021 (On Demand) Sale priceMember Price: $49.00
Non-Member Price: $99.00
F11600 - SEMI F116 - Guide for Drain Segregation for Semiconductor Manufacturing Tools to Support Site Water Reuse
D08200 - SEMI D82 - Test Method for Viewing Angle of Flat Panel Displays
SEMI D82 - Test Method for Viewing Angle of Flat Panel Displays Sale priceMember Price: $148.00
Non-Member Price: $193.00
M09000 - SEMI M90 - Test Method for Bulk Micro Defect Density and Denuded Zone Width in Annealed Silicon Wafers by Optical Microscopy After Preferential Etching
Global Smart MedTech Symposium July (ON DEMAND) 2021
Global Smart MedTech Symposium July (ON DEMAND) 2021 Sale priceMember Price: $199.00
Non-Member Price: $219.00
D08100 - SEMI D81 - Test Method for Dimming Properties of Flat Panel Displays
SEMI D81 - Test Method for Dimming Properties of Flat Panel Displays Sale priceMember Price: $148.00
Non-Member Price: $193.00
3D02200 - SEMI 3D23 - Specification for Glass Carrier Characteristics for Panel Level Packaging (PLP) Applications
M08900 - SEMI M89 - Test Method for Recombination Lifetime of the Epilayer of the Silicon Epitaxial Wafer (p/p+, n/n+) by the Short Wavelength Excitation Microwave Photoconductive Decay Method
Flex Electronics Webinar Master Class: May 2021 (on demand)
Flex Electronics Webinar Master Class: May 2021 (on demand) Sale priceMember Price: $49.00
Non-Member Price: $99.00