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F06000 - SEMI F60 - 不動態化した316Lステンレス・スチール部品の接ガス表面の組成をESCAにより評価する試験方法
SEMI F60 - 不動態化した316Lステンレス・スチール部品の接ガス表面の組成をESCAにより評価する試験方法 Sale priceMember Price: $171.00
Non-Member Price: $224.00
M09300 - SEMI M93 - Test Method for Quantifying Basal Plane Dislocation Density in 4H-SiC by X-Ray Diffraction Topography/Imaging
SEMI M93 - Test Method for Quantifying Basal Plane Dislocation Density in 4H-SiC by X-Ray Diffraction Topography/Imaging Sale priceMember Price: $144.00
Non-Member Price: $187.00
F11500 - SEMI F115 - Test Method for the Determination of Metallic Elements Present on Wetted Surfaces of Ultra High Purity Chemical Delivery Systems and Components
SEMI F115 - Test Method for the Determination of Metallic Elements Present on Wetted Surfaces of Ultra High Purity Chemical Delivery Systems and Components Sale priceMember Price: $144.00
Non-Member Price: $187.00
P04700 - SEMI P47 - Test Method for Evaluation of Line-Edge Roughness and Linewidth Roughness
SEMI P47 - Test Method for Evaluation of Line-Edge Roughness and Linewidth Roughness Sale priceMember Price: $144.00
Non-Member Price: $187.00
F01700 - SEMI F17 - Specification for High Purity Quality Electropolished 316L Stainless Steel Tubing, Component Tube Stubs, and Fittings Made from Tubing
SEMI F17 - Specification for High Purity Quality Electropolished 316L Stainless Steel Tubing, Component Tube Stubs, and Fittings Made from Tubing Sale priceMember Price: $144.00
Non-Member Price: $187.00
E08700 - SEMI E87 - 캐리어 관리 사양
SEMI E87 - 캐리어 관리 사양 Sale priceMember Price: $144.00
Non-Member Price: $187.00
E04000 - SEMI E40 - 프로세싱 관리 표준
SEMI E40 - 프로세싱 관리 표준 Sale priceMember Price: $144.00
Non-Member Price: $187.00
S01500 - SEMI S15 - Safety Guideline for the Evaluation of Toxic and Flammable Gas Detection Systems
SEMI S15 - Safety Guideline for the Evaluation of Toxic and Flammable Gas Detection Systems Sale priceMember Price: $144.00
Non-Member Price: $187.00
S01600 - SEMI S16 - Guide for Semiconductor Manufacturing Equipment Design for Reduction of Environmental Impact at End of Life
SEMI S16 - Guide for Semiconductor Manufacturing Equipment Design for Reduction of Environmental Impact at End of Life Sale priceMember Price: $144.00
Non-Member Price: $187.00
E04500 - SEMI E45 - Test Method for the Determination of Inorganic Contamination from Minienvironments Using VPD-TXRF, VPD-AAS, or VPD/ICP-MS
SEMI E45 - Test Method for the Determination of Inorganic Contamination from Minienvironments Using VPD-TXRF, VPD-AAS, or VPD/ICP-MS Sale priceMember Price: $144.00
Non-Member Price: $187.00
F08200 - SEMI F82 - Specification for Dimension of Mass Flow Controller/Mass Flow Meter for 1.125 Inch Type Surface Mount Gas Distribution Systems
SEMI F82 - Specification for Dimension of Mass Flow Controller/Mass Flow Meter for 1.125 Inch Type Surface Mount Gas Distribution Systems Sale priceMember Price: $144.00
Non-Member Price: $187.00
E02300 - SEMI E23 - Specification for Cassette Transfer Parallel I/O Interface
SEMI E23 - Specification for Cassette Transfer Parallel I/O Interface Sale priceMember Price: $144.00
Non-Member Price: $187.00
T01000 - SEMI T10 - Test Method for the Assessment of 2D Data Matrix Direct Mark Quality
SEMI T10 - Test Method for the Assessment of 2D Data Matrix Direct Mark Quality Sale priceMember Price: $144.00
Non-Member Price: $187.00
S02600 - SEMI S26 - Environmental, Health, and Safety Guideline for FPD Manufacturing System
SEMI S26 - Environmental, Health, and Safety Guideline for FPD Manufacturing System Sale priceMember Price: $144.00
Non-Member Price: $187.00
P02900 - SEMI P29 - Specification for Characteristics Specific to Attenuated Phase Shift Masks and Masks Blanks
SEMI P29 - Specification for Characteristics Specific to Attenuated Phase Shift Masks and Masks Blanks Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF067300 - SEMI MF673 - Test Method for Measuring Resistivity of Semiconductor Wafers or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gauge
SEMI MF673 - Test Method for Measuring Resistivity of Semiconductor Wafers or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gauge Sale priceMember Price: $144.00
Non-Member Price: $187.00
M08700 - SEMI M87 - Test Method for Contactless Resistivity Measurement of Semi-Insulating Semiconductors
SEMI M87 - Test Method for Contactless Resistivity Measurement of Semi-Insulating Semiconductors Sale priceMember Price: $144.00
Non-Member Price: $187.00
M07300 - SEMI M73 - Test Method for Extracting Relevant Characteristics from Measured Wafer Edge Profiles
SEMI M73 - Test Method for Extracting Relevant Characteristics from Measured Wafer Edge Profiles Sale priceMember Price: $144.00
Non-Member Price: $187.00
M04500 - SEMI M45 - Specification for 300 mm Wafer Shipping System
SEMI M45 - Specification for 300 mm Wafer Shipping System Sale priceMember Price: $144.00
Non-Member Price: $187.00
M03100 - SEMI M31 - Specification for Mechanical Features of Front-Opening Shipping Box Used to Transport and Ship 300 mm Wafers
SEMI M31 - Specification for Mechanical Features of Front-Opening Shipping Box Used to Transport and Ship 300 mm Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
G07400 - SEMI G74 - Specification for Tape Frame for 300 mm Wafers
SEMI G74 - Specification for Tape Frame for 300 mm Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
F05700 - SEMI F57 - 超純水および薬液供給システム内に使用するポリマー製材料および部品の仕様
SEMI F57 - 超純水および薬液供給システム内に使用するポリマー製材料および部品の仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00
F03900 - SEMI F39 - Guide for Chemical Blending Systems
SEMI F39 - Guide for Chemical Blending Systems Sale priceMember Price: $144.00
Non-Member Price: $187.00
F04300 - SEMI F43 - Test Method for Determination of Particle Contribution by Point-of-Use Gas Purifiers and Gas Filters
SEMI F43 - Test Method for Determination of Particle Contribution by Point-of-Use Gas Purifiers and Gas Filters Sale priceMember Price: $144.00
Non-Member Price: $187.00