SEMI Standards

SEMI Standards are voluntary technical agreements for the semiconductor, flat panel display, micro-electromechanical systems, photovoltaic, and high-brightness LED industries.

Historical Individual Standards

Historical versions of SEMI Standards are available for purchase. If a document is not available on the Historical Standards page, please contact customer service at 408.943.6901, or by email at customerservice@semi.org, to request that it be added.

Please be aware that information contained in older versions of SEMI Standards may be obsolete. SEMI encourages the use of current Standards.

929 products

D04000 - SEMI D40 - FPD基板の「たわみ」に関する用語
SEMI D40 - FPD基板の「たわみ」に関する用語 Sale priceMember Price: $171.00
Non-Member Price: $224.00
D04000 - SEMI D40 - Terminology for FPD Substrate Deflection
SEMI D40 - Terminology for FPD Substrate Deflection Sale priceMember Price: $144.00
Non-Member Price: $187.00
D03600 - SEMI D36 - LCDバックライトユニットの用語
SEMI D36 - LCDバックライトユニットの用語 Sale priceMember Price: $171.00
Non-Member Price: $224.00
D03600 - SEMI D36 - Terminology for LCD Backlight Unit
SEMI D36 - Terminology for LCD Backlight Unit Sale priceMember Price: $144.00
Non-Member Price: $187.00
D03600 - SEMI D36 - 液晶顯示器背光模組的專用術語
SEMI D36 - 液晶顯示器背光模組的專用術語 Sale priceMember Price: $144.00
Non-Member Price: $187.00
D03500 - SEMI D35 - 冷陰極型蛍光管 (CCFL) 特性の測定試験方法
SEMI D35 - 冷陰極型蛍光管 (CCFL) 特性の測定試験方法 Sale priceMember Price: $171.00
Non-Member Price: $224.00
D03500 - SEMI D35 - Test Method for Measurement of Cold Cathode Fluorescent Lamp (CCFL) Characteristics
D03300 - SEMI D33 - バックライトユニットの光学特性の測定方法
SEMI D33 - バックライトユニットの光学特性の測定方法 Sale priceMember Price: $171.00
Non-Member Price: $224.00
D03300 - SEMI D33 - Measuring Method of Optical Characteristics for Backlight Unit
SEMI D33 - Measuring Method of Optical Characteristics for Backlight Unit Sale priceMember Price: $144.00
Non-Member Price: $187.00
D03200 - SEMI D32 - FPDガラス基板のオリエンテーションコーナ統一にともなう情報管理改善の仕様
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