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1206 products

MS01400 - SEMI MS14 - Guide for Critical Parameters of Gas Sensors
SEMI MS14 - Guide for Critical Parameters of Gas Sensors Sale priceMember Price: $138.00
Non-Member Price: $180.00
T00700 - SEMI T7-0516 (Reapproved 0422) - Specification for Back Surface Marking of Double-Side Polished Wafers with a Two-Dimensional Matrix Code Symbol
E18800 - SEMI E188 - Specification for Malware Free Equipment Integration
SEMI E188 - Specification for Malware Free Equipment Integration Sale priceMember Price: $267.00
Non-Member Price: $355.00
E13700 - SEMI E137 - 半导体制造设备总装、包装、运输、拆箱和搬运指南
SEMI E137 - 半导体制造设备总装、包装、运输、拆箱和搬运指南 Sale priceMember Price: $138.00
Non-Member Price: $180.00
E18000 - SEMI E180 - 通过ICP-MS测量半导体晶圆加工过程中关键腔室部件表面金属污染的试验方法
F02000 - SEMI F20 - 用于通用、高纯和超高纯半导体制造组件的316L不锈钢棒材、锻材、挤压型材、板材和管材的规范
E18700 - SEMI E187 - Specification for Cybersecurity of Fab Equipment
SEMI E187 - Specification for Cybersecurity of Fab Equipment Sale priceMember Price: $267.00
Non-Member Price: $355.00
E18500 - SEMI E185 - Specification for 300 mm Tape Frame FOUP
SEMI E185 - Specification for 300 mm Tape Frame FOUP Sale priceMember Price: $138.00
Non-Member Price: $180.00
E18400 - SEMI E184 - Specification for 300 mm Tape Frame FOUP Load Port
SEMI E184 - Specification for 300 mm Tape Frame FOUP Load Port Sale priceMember Price: $138.00
Non-Member Price: $180.00
F11900 - SEMI F119 - Test Method for Determining the Critical Pitting Temperature of Stainless Steel Surfaces Used in Corrosive Gas Systems by Use of a Ferric Chloride Solution
F11800 - SEMI F118 - Test Method for Determination of Moisture Dry-Down Characteristics of Gas Delivery Components
F11700 - SEMI F117 - Specification for Dimensions of Sandwich Components for 1.125 Inch Type Surface Mount Gas Distribution Systems
E18600 - SEMI E186 - Specification for Location and Dimensions for Power Connectors and Ethercat Ports in Mass Flow Controllers and Mass Flow Meters
E18300 - SEMI E183 - Specification for Rich Interactive Test Database (RITdb)
SEMI E183 - Specification for Rich Interactive Test Database (RITdb) Sale priceMember Price: $138.00
Non-Member Price: $180.00
C10300 - SEMI C103 - Guide for Reporting Performance Parameters of the Chemical Mechanical Planarization (CMP) Conditioning Disks Used in Semiconductor Manufacturing
F11600 - SEMI F116 - Guide for Drain Segregation for Semiconductor Manufacturing Tools to Support Site Water Reuse
A00401 - SEMI A4.1 - Specification for HTTP JSON Protocol Implementation for Tester Event Messaging for Semiconductors (TEMS)
D08200 - SEMI D82 - Test Method for Viewing Angle of Flat Panel Displays
SEMI D82 - Test Method for Viewing Angle of Flat Panel Displays Sale priceMember Price: $138.00
Non-Member Price: $180.00
M09000 - SEMI M90 - Test Method for Bulk Micro Defect Density and Denuded Zone Width in Annealed Silicon Wafers by Optical Microscopy After Preferential Etching
D08100 - SEMI D81 - Test Method for Dimming Properties of Flat Panel Displays
SEMI D81 - Test Method for Dimming Properties of Flat Panel Displays Sale priceMember Price: $138.00
Non-Member Price: $180.00
3D02200 - SEMI 3D23 - Specification for Glass Carrier Characteristics for Panel Level Packaging (PLP) Applications
M08900 - SEMI M89 - Test Method for Recombination Lifetime of the Epilayer of the Silicon Epitaxial Wafer (p/p+, n/n+) by the Short Wavelength Excitation Microwave Photoconductive Decay Method
C10200 - SEMI C102 - Guide for Reporting Density and Porosity of Chemical Mechanical Planarization (CMP) Polishing Pads Used in Semiconductor Manufacturing
C10100 - SEMI C101 - Test Method for Determining pH of Chemical Mechanical Planarization (CMP) Slurries and Related Chemicals
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