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SEMI F64 - マスフローコントローラの指示および実流量に対する圧力影響を測定する試験方法 Sale priceMember Price: $171.00
Non-Member Price: $224.00

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SEMI F62 - 周囲およびガス温度の影響からマスフローコントローラ性能特性を決定する試験方法 Sale priceMember Price: $171.00
Non-Member Price: $224.00

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SEMI F15 - 筐体の試験方法（六フッ化硫黄のトレーサガス）のSEMI S6への移行 Sale priceMember Price: $171.00
Non-Member Price: $224.00

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SEMI F37 - ガス供給システム構成部品の表面粗さパラメータの算出方法 Sale priceMember Price: $171.00
Non-Member Price: $224.00

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SEMI F29 - ガスソースシステムパネルのパージ効果のテスト方法 Sale priceMember Price: $171.00
Non-Member Price: $224.00

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SEMI F20 - 高純度および超高純度の半導体製造アプリケーションで使用される汎用コンポーネント用の316Lステンレス鋼の棒鋼，鍛造品，押出成形品，鋼板，鋼管の仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00

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SEMI F79 - ガス配送コンポーネントに使用されるガスのシリコンとの適合性に関するガイド Sale priceMember Price: $171.00
Non-Member Price: $224.00

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SEMI F30 - 据付現場における微量ガス不純物およびパーティクルに関する精製器性能テストの始動および検証 Sale priceMember Price: $171.00
Non-Member Price: $224.00

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SEMI F15 - Test Method for Enclosures Using Sulfur Hexafluoride Tracer Gas and Gas Chromatography Sale price Member Price : $144.00

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SEMI MF657 - Test Method for Measuring Warp and Total Thickness Variation on Silicon Wafers by Noncontact Scanning Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI MF534 - Test Method for Bow of Silicon Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI MF399 - Test Method for Thickness of Heteroepitaxial or Polysilicon Layers Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI MF398 - Test Method for Majority Carrier Concentration in Semiconductors by Measurement of Wavenumber or Wavelength of the Plasma Resonance Minimum Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI MF2166 - Practices for Monitoring Non-Contact Dielectric Characterization Systems Through Use of Special Reference Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI MF1724 - Test Method for Measuring Surface Metal Contamination of Polycrystalline Silicon by Acid Extraction-Atomic Absorption Spectroscopy Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI MF1723 - Practice for Evaluation of Polycrystalline Silicon Rods by Float-Zone Crystal Growth and Spectroscopy Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI MF1708 - Practice for Evaluation of Granular Polysilicon by Melter-Zoner Spectroscopies Sale priceMember Price: $144.00
Non-Member Price: $187.00

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SEMI M9 - 鏡面単結晶ガリウムヒ素スライスの仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00

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SEMI M81 - 単結晶シリコンカーバイド基板に存在する欠陥についてのガイド Sale priceMember Price: $171.00
Non-Member Price: $224.00

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SEMI M80 - 450 mmウェーハの搬送および出荷用フロントオープニング・シッピングボックスの機械仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00

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SEMI M8 - 鏡面単結晶シリコンテストウェーハの仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00

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SEMI M79 - 太陽電池用円盤状100 mm鏡面研磨単結晶ゲルマニウムウェーハの仕様 Sale priceMember Price: $171.00
Non-Member Price: $224.00

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SEMI M78 - 量産時における130nmから22nm世代のパターンなしシリコンウェーハ上のナノトポグラフィー決定に関するガイド Sale priceMember Price: $171.00
Non-Member Price: $224.00

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SEMI M76 - 開発用直径450 mmシリコン単結晶鏡面ウェーハの仕様 Regular price$360.00 USD Sale price$224.00 USD