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MF136600 - SEMI MF1366 - Test Method for Measuring Oxygen Concentration in Heavily Doped Silicon Substrates by Secondary Ion Mass Spectrometry
SEMI MF1366 - Test Method for Measuring Oxygen Concentration in Heavily Doped Silicon Substrates by Secondary Ion Mass Spectrometry Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF123900 - SEMI MF1239 - Test Method for Oxygen Precipitation Characteristics of Silicon Wafers by Measurement of Interstitial Oxygen Reduction
SEMI MF1239 - Test Method for Oxygen Precipitation Characteristics of Silicon Wafers by Measurement of Interstitial Oxygen Reduction Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF118800 - SEMI MF1188 - Test Method for Interstitial Oxygen Content of Silicon by Infrared Absorption With Short Baseline
SEMI MF1188 - Test Method for Interstitial Oxygen Content of Silicon by Infrared Absorption With Short Baseline Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF115300 - SEMI MF1153 - Test Method for Characterization of Metal-Oxide Silicon (MOS) Structures by Capacitance-Voltage Measurements
SEMI MF1153 - Test Method for Characterization of Metal-Oxide Silicon (MOS) Structures by Capacitance-Voltage Measurements Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF115200 - SEMI MF1152 - Test Method for Dimensions of Notches on Silicon Wafers
SEMI MF1152 - Test Method for Dimensions of Notches on Silicon Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
MF104800 - SEMI MF1048 - Test Method for Measuring the Reflective Total Integrated ScatterMF104800 - SEMI MF1048 - Test Method for Measuring the Reflective Total Integrated Scatter
SEMI MF1048 - Test Method for Measuring the Reflective Total Integrated Scatter Sale priceMember Price: $144.00
Non-Member Price: $187.00
M08600 - SEMI M86 - Specification for Polished Monocrystalline c-Plane Gallium Nitride Wafers
SEMI M86 - Specification for Polished Monocrystalline c-Plane Gallium Nitride Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
M07700 - SEMI M77 - Test Method for Determining Wafer Near-Edge Geometry Using Roll-Off Amount, ROA
SEMI M77 - Test Method for Determining Wafer Near-Edge Geometry Using Roll-Off Amount, ROA Sale priceMember Price: $144.00
Non-Member Price: $187.00
M06400 - SEMI M64 - Test Method for the EL2 Deep Donor Concentration in Semi-Insulating (SI) Gallium Arsenide Single Crystals by Infrared Absorption Spectroscopy
SEMI M64 - Test Method for the EL2 Deep Donor Concentration in Semi-Insulating (SI) Gallium Arsenide Single Crystals by Infrared Absorption Spectroscopy Sale priceMember Price: $144.00
Non-Member Price: $187.00
M05400 - SEMI M54 - Guide for Semi-Insulating (SI) GaAs Material Parameters
SEMI M54 - Guide for Semi-Insulating (SI) GaAs Material Parameters Sale priceMember Price: $144.00
Non-Member Price: $187.00
M04100 - SEMI M41 - Specification of Silicon-on-Insulator (SOI) for Power Device/ICs
SEMI M41 - Specification of Silicon-on-Insulator (SOI) for Power Device/ICs Sale priceMember Price: $144.00
Non-Member Price: $187.00
M01000 - SEMI M10 - Terminology for Identification of Structures and Features Seen on Gallium Arsenide Wafers
SEMI M10 - Terminology for Identification of Structures and Features Seen on Gallium Arsenide Wafers Sale priceMember Price: $144.00
Non-Member Price: $187.00
G06600 - SEMI G66 - Test Method for the Measurement of Water Absorption Characteristics for Semiconductor Plastic Molding Compounds
SEMI G66 - Test Method for the Measurement of Water Absorption Characteristics for Semiconductor Plastic Molding Compounds Sale priceMember Price: $144.00
Non-Member Price: $187.00
G05200 - SEMI G52 - Test Method for Measurement of Ionic Contamination on Semiconductor Leadframes
SEMI G52 - Test Method for Measurement of Ionic Contamination on Semiconductor Leadframes Sale priceMember Price: $144.00
Non-Member Price: $187.00
G06300 - SEMI G63 - ダイ剪断強度の測定方法
SEMI G63 - ダイ剪断強度の測定方法 Sale priceMember Price: $171.00
Non-Member Price: $224.00
G01100 - SEMI G11 - Practice for RAM Follower Gel Time and Spiral Flow of Thermal Setting Molding Compounds
SEMI G11 - Practice for RAM Follower Gel Time and Spiral Flow of Thermal Setting Molding Compounds Sale priceMember Price: $144.00
Non-Member Price: $187.00
F04400 - SEMI F44 - Specification for Machined Stainless Steel Weld Fittings
SEMI F44 - Specification for Machined Stainless Steel Weld Fittings Sale price Member Price : $144.00
F04500 - SEMI F45 - Specification for Machined Stainless Steel Reducing Weld Fittings
SEMI F45 - Specification for Machined Stainless Steel Reducing Weld Fittings Sale price Member Price : $144.00
F02300 - SEMI F23 - Specification for Particle Concentration of Grade 10/0.2 Hydrogen
SEMI F23 - Specification for Particle Concentration of Grade 10/0.2 Hydrogen Sale priceMember Price: $144.00
Non-Member Price: $187.00
F05400 - SEMI F54 - Test Method for Measuring the Counting Efficiency of Condensation Nucleus Counters
SEMI F54 - Test Method for Measuring the Counting Efficiency of Condensation Nucleus Counters Sale priceMember Price: $144.00
Non-Member Price: $187.00
F02500 - SEMI F25 - Specification for Particle Concentration of Grade 10/0.2 Oxidant Specialty Gases
SEMI F25 - Specification for Particle Concentration of Grade 10/0.2 Oxidant Specialty Gases Sale priceMember Price: $144.00
Non-Member Price: $187.00
F02400 - SEMI F24 - Specification for Particle Concentration of Grade 10/0.2 Inert Specialty Gases
SEMI F24 - Specification for Particle Concentration of Grade 10/0.2 Inert Specialty Gases Sale priceMember Price: $144.00
Non-Member Price: $187.00
F11100 - SEMI F111 - Test Method for Equipment Fan Filter Unit (EFFU) Particle Removal
SEMI F111 - Test Method for Equipment Fan Filter Unit (EFFU) Particle Removal Sale priceMember Price: $144.00
Non-Member Price: $187.00
E09100 - SEMI E91 - Specification for Prober Specific Equipment Model (PSEM)
SEMI E91 - Specification for Prober Specific Equipment Model (PSEM) Sale price Member Price : $144.00