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SEMI M68 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Height Data Array Using a Curvature Metric, ZDD Sale priceMember Price: $144.00
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SEMI M67 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Thickness Data Array Using the ESFQR, ESFQD, and ESBIR Metrics Sale priceMember Price: $144.00
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SEMI M66 - Test Method to Extract Effective Work Function in Oxide and High-K Gate Stacks Using the MIS Flat Band Voltage-Insulator Thickness Technique Sale priceMember Price: $144.00
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SEMI M66 - MISフラットバンド電圧―絶縁膜厚法を使った，酸化膜，およびhigh-κゲートスタックの有効仕事関数の算出方法 Sale priceMember Price: $171.00
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SEMI M65 - Specification for Sapphire Substrates to use for Compound Semiconductor Epitaxial Wafers Sale priceMember Price: $144.00
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SEMI M65 - 化合物半導体エピタキシャルウェーハに使用するサファイア基板の仕様 Sale priceMember Price: $171.00
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SEMI M64 - Test Method for the EL2 Deep Donor Concentration in Semi-Insulating (SI) Gallium Arsenide Single Crystals by Infrared Absorption Spectroscopy Sale priceMember Price: $144.00
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SEMI M64 - 赤外線吸収スペクトル法による絶縁（SI）ガリウムヒ素単結晶内のEL2深いドナー濃度の試験方法 Sale priceMember Price: $171.00
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SEMI M63 - Test Method for Measuring the Al Fraction in AlGaAs on GaAs Substrates by High Resolution X-Ray Diffraction Sale priceMember Price: $144.00
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SEMI M63 - 化合物半導体エピタキシャルウェーハに使用するサファイア基板の仕様 Sale priceMember Price: $171.00
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SEMI M62 - Specification for Silicon Epitaxial Wafers Sale priceMember Price: $144.00
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SEMI M6 - 太陽光電池用シリコンウェーハの仕様 Sale priceMember Price: $171.00
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SEMI M61 - 埋め込み層付きシリコンエピタキシャルウェーハの仕様 Sale priceMember Price: $171.00
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SEMI M61 - Specification for Silicon Epitaxial Wafers with Buried Layers Sale priceMember Price: $144.00
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SEMI M60 - Test Method for Time Dependent Dielectric Breakdown Characteristics of SiO2 Films for Si Wafer Evaluation Sale priceMember Price: $144.00
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SEMI M60 - シリコンウェーハ評価のためのSiO2の経時絶縁破壊特性の試験方法 Sale priceMember Price: $171.00
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SEMI M59 - Terminology for Silicon Technology Sale priceMember Price: $144.00
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SEMI M59 - シリコン技術の用語集 Sale priceMember Price: $171.00
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SEMI M58 - Test Method for Evaluating DMA Based Particle Deposition Systems and Processes Sale priceMember Price: $144.00
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SEMI M58 - DMAを基にしたパーティクル堆積システムとプロセス評価のためのテスト方法 Sale priceMember Price: $171.00
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SEMI M57 - Specification for Silicon Annealed Wafers Sale priceMember Price: $144.00
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SEMI M56 - Practice for Determining Cost Components for Metrology Equipment Due to Measurement Variability and Bias Sale priceMember Price: $144.00
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SEMI M55 - Specification for Polished Monocrystalline Silicon Carbide Wafers Sale priceMember Price: $144.00
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SEMI M54 - Guide for Semi-Insulating (SI) GaAs Material Parameters Sale priceMember Price: $144.00
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