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SEMI M54 - 半絶縁性（SI）GaAs材料のパラメータのガイド Sale priceMember Price: $171.00
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SEMI M53 - Practice for Calibrating Scanning Surface Inspection Systems Using Certified Depositions of Monodispere Reference Spheres on Unpatterned Semiconductor Wafer Surfaces Sale priceMember Price: $144.00
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SEMI M52 - Guide for Specifying Scanning Surface Inspection Systems for Silicon Wafers for the 130 nm to 5 nm Technology Generations Sale priceMember Price: $144.00
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SEMI M51 - Test Method for Characterizing Silicon Wafer by Gate Oxide Integrity Sale priceMember Price: $144.00
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SEMI M50 - Test Method for Determining Capture Rate and False Count Rate for Surface Scanning Inspection Systems by the Overlay Method Sale priceMember Price: $144.00
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SEMI M49 - Guide for Specifying Geometry Measurement Systems for Silicon Wafers for the 130 nm to 16 nm Technology Generations Sale priceMember Price: $144.00
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SEMI M46 - Test Method for Measuring Carrier Concentrations in Epitaxial Layer Structures by ECV Profiling Sale priceMember Price: $144.00
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SEMI M46 - ECV法によりエピタキシァル層内のキャリア密度プロファイルを測定するための試験方法 Sale priceMember Price: $171.00
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SEMI M45 - Specification for 300 mm Wafer Shipping System Sale priceMember Price: $144.00
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SEMI M44 - Guide to Conversion Factors for Interstitial Oxygen in Silicon Sale priceMember Price: $144.00
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SEMI M44 - シリコン中の酸素の換算係数ガイド Sale priceMember Price: $171.00
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SEMI M43 - Guide for Reporting Wafer Nanotopography Sale priceMember Price: $144.00
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SEMI M42 - Specification for Compound Semiconductor Epitaxial Wafers Sale priceMember Price: $144.00
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SEMI M42 - 化合物半導体エピタキシャルウェーハの仕様 Sale priceMember Price: $171.00
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SEMI M41 - 電源デバイス／IC用シリコン・オン・インシュレーター（SOI）の仕様 Sale priceMember Price: $171.00
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SEMI M41 - Specification of Silicon-on-Insulator (SOI) for Power Device/ICs Sale priceMember Price: $144.00
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SEMI M40 - Guide for Measurement of Roughness of Planar Surfaces on Polished Wafers Sale priceMember Price: $144.00
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SEMI M40 - シリコンウェーハ表面のラフネス測定のガイド Sale priceMember Price: $171.00
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SEMI M38 - Specification for Polished Reclaimed Silicon Wafers Sale priceMember Price: $144.00
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SEMI M35 - Guide for Developing Specifications for Silicon Wafer Surface Features Detected by Automated Inspection Sale priceMember Price: $144.00
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SEMI M35 - 自動検査により検出されるシリコンウェーハ表面特性の仕様を開発するためのガイド Sale priceMember Price: $171.00
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SEMI M31 - Specification for Mechanical Features of Front-Opening Shipping Box Used to Transport and Ship 300 mm Wafers Sale priceMember Price: $144.00
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SEMI M23 - Specification for Polished Monocrystalline Indium Phosphide Wafers Sale priceMember Price: $144.00
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SEMI M21 - Guide for Assigning Addresses to Rectangular Elements in a Cartesian Array Sale priceMember Price: $144.00
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