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M04700 - SEMI M47 - Specification for Silicon-on-Insulator (SOI) Wafers for CMOS LSI Applications
M04500 - SEMI M45 - 300 mmウェーハシッピングシステムに関する暫定仕様
SEMI M45 - 300 mmウェーハシッピングシステムに関する暫定仕様 Sale priceMember Price: $176.00
Non-Member Price: $231.00
M04300 - SEMI M43 - ウェーハナノポトグラフィを報告するためのガイド
SEMI M43 - ウェーハナノポトグラフィを報告するためのガイド Sale priceMember Price: $176.00
Non-Member Price: $231.00
M00400 - SEMI M4 - Specifications for SOS Epitaxial Wafers
SEMI M4 - Specifications for SOS Epitaxial Wafers Sale priceMember Price: $148.00
Non-Member Price: $193.00
M03900 - SEMI M39 - 半絶縁GaAs単結晶の抵抗率及びホール係数を測定しホール移動度を決定する方法
M03900 - SEMI M39 - Test Method for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Semi-Insulating GaAs Single Crystals
M03800 - SEMI M38 - 鏡面リクレイムシリコンウェーハの仕様
SEMI M38 - 鏡面リクレイムシリコンウェーハの仕様 Sale priceMember Price: $176.00
Non-Member Price: $231.00
M03700 - SEMI M37 - 低転位密度Inp基板のエッチピット密度(EPD)測定方法
SEMI M37 - 低転位密度Inp基板のエッチピット密度(EPD)測定方法 Sale priceMember Price: $176.00
Non-Member Price: $231.00
M03700 - SEMI M37 - Test Method for Measuring Etch Pit Density (EPD) in Low Dislocation Density Indium Phosphide Wafers
M03600 - SEMI M36 - 低転位密度GaAs基板のエッチピット密度(EPD)測定方法
SEMI M36 - 低転位密度GaAs基板のエッチピット密度(EPD)測定方法 Sale priceMember Price: $176.00
Non-Member Price: $231.00
M03600 - SEMI M36 - Test Method for Measuring Etch Pit Density (EPD) in Low Dislocation Density Gallium Arsenide Wafers
M03400 - SEMI M34 - Guide for Specifying SIMOX Wafers
SEMI M34 - Guide for Specifying SIMOX Wafers Sale priceMember Price: $148.00
Non-Member Price: $193.00
M03400 - SEMI M34 - SIMOXウェーハを規定するための指針
SEMI M34 - SIMOXウェーハを規定するための指針 Sale priceMember Price: $176.00
Non-Member Price: $180.00
M03300 - SEMI M33 - Test Method for the Determination of Residual Surface Contamination on Silicon Wafers by Means of Total Reflection X-Ray Fluorescence Spectroscopy (TXRF)
M03200 - SEMI M32 - 統計的仕様のガイド
SEMI M32 - 統計的仕様のガイド Sale priceMember Price: $176.00
Non-Member Price: $231.00
M03200 - SEMI M32 - Guide to Statistical Specifications
SEMI M32 - Guide to Statistical Specifications Sale priceMember Price: $148.00
Non-Member Price: $193.00
M03100 - SEMI M31 - 300 mmウェーハの搬送および出荷用フロントオープニング・シッピングボックスの機械仕様
M03000 - SEMI M30 - Standard Test Method for Substitutional Atomic Carbon Concentration in GaAs by Fourier Transform Infrared Absorption Spectroscopy
M00300 - SEMI M3 - Specifications for Polished Monocrystalline Sapphire Substrates
SEMI M3 - Specifications for Polished Monocrystalline Sapphire Substrates Sale priceMember Price: $148.00
Non-Member Price: $193.00
M02900 - SEMI M29 - 300 mmシッピングボックスの仕様
SEMI M29 - 300 mmシッピングボックスの仕様 Sale priceMember Price: $176.00
Non-Member Price: $231.00
M02900 - SEMI M29 - Specification for 300 mm Shipping Box
SEMI M29 - Specification for 300 mm Shipping Box Sale priceMember Price: $148.00
Non-Member Price: $193.00
M02600 - SEMI M26 - ウェーハの運搬に使用される100 mm,125 mm,150 mm,200 mmウェーハシッピングボックスの再利用ガイド
M02600 - SEMI M26 - Guide for the Re-Use of 100, 125, 150, and 200 mm Wafer Shipping Boxes Used to Transport Wafers
M02400 - SEMI M24 - 鏡面単結晶プレミアムシリコンウェーハの仕様
SEMI M24 - 鏡面単結晶プレミアムシリコンウェーハの仕様 Sale priceMember Price: $176.00
Non-Member Price: $231.00