Popular Standards – Page 13

675 products

S01800 - SEMI S18 - 矽烷族氣體處理之安全衛生及環保基準

SEMI S18 - 矽烷族氣體處理之安全衛生及環保基準

Member Price: $148.00
Non-Member Price: $193.00

PV08000 - SEMI PV80 - Specification of Indoor Lighting Simulator Requirements for Emerging Photovoltaic and Perovskite Solar Cell (PSC)

SEMI PV80 - Specification of Indoor Lighting Simulator Requirements for Emerging Photovoltaic and Perovskite Solar Cell (PSC)

Member Price: $148.00
Non-Member Price: $193.00

PV07600 - SEMI PV76 - Test Method for Durability of Low Light Intensity Organic Photovoltaic (OPV) and Dye-Sensitized Solar Cell (DSSC) and Perovskite Solar Cell (PSC)

SEMI PV76 - Test Method for Durability of Low Light Intensity Organic Photovoltaic (OPV) and Dye-Sensitized Solar Cell (DSSC) and Perovskite Solar Cell (PSC)

Member Price: $148.00
Non-Member Price: $193.00

PV07500 - SEMI PV75 - Test Method on Cell Level for Potential-Induced Degradation Susceptibility of Solar Cells and Module Encapsulation Materials

SEMI PV75 - Test Method on Cell Level for Potential-Induced Degradation Susceptibility of Solar Cells and Module Encapsulation Materials

Member Price: $148.00
Non-Member Price: $193.00

PV05400 - SEMI PV54 - Specification for Silver Paste, Used to Contact with N+ Diffusion Layer of Crystalline Silicon Solar Cells

SEMI PV54 - Specification for Silver Paste, Used to Contact with N+ Diffusion Layer of Crystalline Silicon Solar Cells

Member Price: $148.00
Non-Member Price: $193.00

PV05100 - SEMI PV51 - Test Method for In-Line Characterization of Photovoltaic Silicon Wafers by Using Photoluminescence

SEMI PV51 - Test Method for In-Line Characterization of Photovoltaic Silicon Wafers by Using Photoluminescence

Member Price: $148.00
Non-Member Price: $193.00

P04000 - SEMI P40 - Specification for Mounting Requirements for Extreme Ultraviolet Lithography Masks

SEMI P40 - Specification for Mounting Requirements for Extreme Ultraviolet Lithography Masks

Member Price: $148.00
Non-Member Price: $193.00

$MF057600 - SEMI MF576 - Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry$

SEMI MF576 - Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry

Member Price: $148.00
Non-Member Price: $193.00

MF037400 - SEMI MF374 - Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure

SEMI MF374 - Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure

Member Price: $148.00
Non-Member Price: $193.00

MF180900 - SEMI MF1809 - Guide for Selection and Use of Etching Solutions to Delineate Structural Defects in Silicon

SEMI MF1809 - Guide for Selection and Use of Etching Solutions to Delineate Structural Defects in Silicon

Member Price: $148.00
Non-Member Price: $193.00

MF163000 - SEMI MF1630 - Test Method for Low Temperature FT-IR Analysis of Single Crystal Silicon for III-V Impurities

SEMI MF1630 - Test Method for Low Temperature FT-IR Analysis of Single Crystal Silicon for III-V Impurities

Member Price: $148.00
Non-Member Price: $193.00

MF153500 - SEMI MF1535 - Test Method for Carrier Recombination Lifetime in Electronic-Grade Silicon Wafers by Noncontact Measurement of Photoconductivity Decay by Microwave Reflectance

SEMI MF1535 - Test Method for Carrier Recombination Lifetime in Electronic-Grade Silicon Wafers by Noncontact Measurement of Photoconductivity Decay by Microwave Reflectance

Member Price: $148.00
Non-Member Price: $193.00

MF145100 - SEMI MF1451 - Test Method for Measuring Sori on Silicon Wafers by Automated Noncontact Scanning

SEMI MF1451 - Test Method for Measuring Sori on Silicon Wafers by Automated Noncontact Scanning

Member Price: $148.00
Non-Member Price: $193.00

MF139200 - SEMI MF1392 - Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements with a Mercury Probe

SEMI MF1392 - Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements with a Mercury Probe

Member Price: $148.00
Non-Member Price: $193.00

MF118800 - SEMI MF1188 - Test Method for Interstitial Oxygen Content of Silicon by Infrared Absorption With Short Baseline

SEMI MF1188 - Test Method for Interstitial Oxygen Content of Silicon by Infrared Absorption With Short Baseline

Member Price: $148.00
Non-Member Price: $193.00

MF011000 - SEMI MF110 - Test Method for Thickness of Epitaxial or Diffused Layers in Silicon by the Angle Lapping and Staining Technique

SEMI MF110 - Test Method for Thickness of Epitaxial or Diffused Layers in Silicon by the Angle Lapping and Staining Technique

Member Price: $148.00
Non-Member Price: $193.00

M05000 - SEMI M50 - Test Method for Determining Capture Rate and False Count Rate for Surface Scanning Inspection Systems by the Overlay Method

SEMI M50 - Test Method for Determining Capture Rate and False Count Rate for Surface Scanning Inspection Systems by the Overlay Method

Member Price: $148.00
Non-Member Price: $193.00

M03500 - SEMI M35 - Guide for Developing Specifications for Silicon Wafer Surface Features Detected by Automated Inspection

SEMI M35 - Guide for Developing Specifications for Silicon Wafer Surface Features Detected by Automated Inspection

Member Price : $148.00

HB00100 - SEMI HB1 - Specification for Sapphire Wafers Intended for Use for Manufacturing High Brightness-Light Emitting Diode Devices

SEMI HB1 - Specification for Sapphire Wafers Intended for Use for Manufacturing High Brightness-Light Emitting Diode Devices

Member Price: $148.00
Non-Member Price: $193.00

G06400 - SEMI G64 - Specification for Full-Plated Integrated Circuit Leadframes (Au, Ag, Cu, Ni, Pd/Ni, Pd)

SEMI G64 - Specification for Full-Plated Integrated Circuit Leadframes (Au, Ag, Cu, Ni, Pd/Ni, Pd)

Member Price: $148.00
Non-Member Price: $193.00

G08200 - SEMI G82 - Specification for 300 mm Load Port for Frame Cassettes in Backend Process

SEMI G82 - Specification for 300 mm Load Port for Frame Cassettes in Backend Process

Member Price: $148.00
Non-Member Price: $193.00

G01100 - SEMI G11 - Practice for RAM Follower Gel Time and Spiral Flow of Thermal Setting Molding Compounds

SEMI G11 - Practice for RAM Follower Gel Time and Spiral Flow of Thermal Setting Molding Compounds

Member Price: $148.00
Non-Member Price: $193.00

F05500 - SEMI F55 - Test Method for Determining the Corrosion Resistance of Mass Flow Controllers

SEMI F55 - Test Method for Determining the Corrosion Resistance of Mass Flow Controllers

Member Price: $148.00
Non-Member Price: $193.00

F07600 - SEMI F76 - Test Method for Evaluation of Particle Contribution from Gas System Components Exposed to Corrosive Gas

SEMI F76 - Test Method for Evaluation of Particle Contribution from Gas System Components Exposed to Corrosive Gas

Member Price: $148.00
Non-Member Price: $193.00

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