Popular Standards – Page 11

675 products

C10200 - SEMI C102 - Guide for Reporting Density and Porosity of Chemical Mechanical Planarization (CMP) Polishing Pads Used in Semiconductor Manufacturing

SEMI C102 - Guide for Reporting Density and Porosity of Chemical Mechanical Planarization (CMP) Polishing Pads Used in Semiconductor Manufacturing

Member Price: $148.00
Non-Member Price: $193.00

PV09400 - SEMI PV94 - Guide for Identifying Cell Defects In Crystalline Silicon Photovoltaic (PV) Modules By Electroluminescence (EL) Imaging

SEMI PV94 - Guide for Identifying Cell Defects In Crystalline Silicon Photovoltaic (PV) Modules By Electroluminescence (EL) Imaging

Member Price: $148.00
Non-Member Price: $193.00

MS01200 - SEMI MS12 - Specification for Silicon Substrates Used in Fabrication of MEMS Devices

SEMI MS12 - Specification for Silicon Substrates Used in Fabrication of MEMS Devices

Member Price: $148.00
Non-Member Price: $193.00

PV09100 - SEMI PV91 - Specification for Trichlorosilane Used in Polysilicon Production

SEMI PV91 - Specification for Trichlorosilane Used in Polysilicon Production

Member Price: $148.00
Non-Member Price: $193.00

E17700 - SEMI E177 - Specification for Transmission Electron Microscope (TEM) Lamella Carriers Used in Electron Microscopy Workflows

SEMI E177 - Specification for Transmission Electron Microscope (TEM) Lamella Carriers Used in Electron Microscopy Workflows

Member Price: $148.00
Non-Member Price: $193.00

MS00500 - SEMI MS5 - Test Method for Wafer Bond Strength Measurements Using Micro-Chevron Test Structures

SEMI MS5 - Test Method for Wafer Bond Strength Measurements Using Micro-Chevron Test Structures

Member Price: $148.00
Non-Member Price: $193.00

E00400 - SEMI E4 - 半導体製造装置通信スタンダード1　メッセージトランスファ（SECS-I）

SEMI E4 - 半導体製造装置通信スタンダード1　メッセージトランスファ（SECS-I）

Member Price: $176.00
Non-Member Price: $231.00

PV08900 - SEMI PV89 - Test Method of Current-Voltage (I-V) Measurement in Indoor Lighting for Dye-Sensitized Solar Cell and Organic Photovoltaic and Perovskite Solar Cell (PSC)

SEMI PV89 - Test Method of Current-Voltage (I-V) Measurement in Indoor Lighting for Dye-Sensitized Solar Cell and Organic Photovoltaic and Perovskite Solar Cell (PSC)

Member Price: $148.00
Non-Member Price: $193.00

T00900 - SEMI T9 - Specification for Marking of Metal Lead-Frame Strips with a Two-Dimensional Data Matrix Code Symbol

SEMI T9 - Specification for Marking of Metal Lead-Frame Strips with a Two-Dimensional Data Matrix Code Symbol

Member Price: $148.00
Non-Member Price: $193.00

S01700 - SEMI S17 - 無人搬送台車（UTV）システムの安全ガイドライン

SEMI S17 - 無人搬送台車（UTV）システムの安全ガイドライン

Member Price: $176.00
Non-Member Price: $231.00

PV00900 - SEMI PV9 - Test Method for Excess Charge Carrier Decay in PV Silicon Materials by Non-Contact Measurements of Microwave Reflectance After a Short Illumination Pulse

SEMI PV9 - Test Method for Excess Charge Carrier Decay in PV Silicon Materials by Non-Contact Measurements of Microwave Reflectance After a Short Illumination Pulse

Member Price: $148.00
Non-Member Price: $193.00

PV05700 - SEMI PV57 - Test Method For Current-Voltage (I-V) Performance Measurement of Organic Photovoltaic (OPV) and Dye-Sensitized Solar Cell (DSSC) and Perovskite Solar Cell (PSC)

SEMI PV57 - Test Method For Current-Voltage (I-V) Performance Measurement of Organic Photovoltaic (OPV) and Dye-Sensitized Solar Cell (DSSC) and Perovskite Solar Cell (PSC)

Member Price : $148.00

PV0036 - SEMI PV36 - Specification for Hydrogen Peroxide Used in Photovoltaic Applications

SEMI PV36 - Specification for Hydrogen Peroxide Used in Photovoltaic Applications

Member Price: $148.00
Non-Member Price: $193.00

P04800 - SEMI P48 - Specification of Fiducial Marks for EUV Mask Blank

SEMI P48 - Specification of Fiducial Marks for EUV Mask Blank

Member Price: $148.00
Non-Member Price: $193.00

MF009500 - SEMI MF95 - Test Method for Thickness of Lightly Doped Silicon Epitaxial Layers on Heavily Doped Silicon Substrates Using an Infrared Dispersive Spectrophotometer

SEMI MF95 - Test Method for Thickness of Lightly Doped Silicon Epitaxial Layers on Heavily Doped Silicon Substrates Using an Infrared Dispersive Spectrophotometer

Member Price: $148.00
Non-Member Price: $193.00

MF004200 - SEMI MF42 - Test Method for Conductivity Type of Extrinsic Semiconducting Materials

SEMI MF42 - Test Method for Conductivity Type of Extrinsic Semiconducting Materials

Member Price: $148.00
Non-Member Price: $193.00

MF213900 - SEMI MF2139 - Test Method for Measuring Nitrogen Concentration in Silicon Substrates by Secondary Ion Mass Spectrometry

SEMI MF2139 - Test Method for Measuring Nitrogen Concentration in Silicon Substrates by Secondary Ion Mass Spectrometry

Member Price: $148.00
Non-Member Price: $193.00

SEMI MF1811 - Guide for Estimating the Power Spectral Density Function and Related Finish Parameters from Surface Profile Data

Member Price: $148.00
Non-Member Price: $193.00

MF138900 - SEMI MF1389 - Test Method for Photoluminescence Analysis of Single Crystal Silicon for III-V Impurities

SEMI MF1389 - Test Method for Photoluminescence Analysis of Single Crystal Silicon for III-V Impurities

Member Price: $148.00
Non-Member Price: $193.00

M03800 - SEMI M38 - Specification for Polished Reclaimed Silicon Wafers

SEMI M38 - Specification for Polished Reclaimed Silicon Wafers

Member Price: $148.00
Non-Member Price: $193.00

M01000 - SEMI M10 - Terminology for Identification of Structures and Features Seen on Gallium Arsenide Wafers

SEMI M10 - Terminology for Identification of Structures and Features Seen on Gallium Arsenide Wafers

Member Price: $148.00
Non-Member Price: $193.00

F06400 - SEMI F64 - Test Method for Determining Pressure Effects on Indicated and Actual Flow for Mass Flow Controllers

SEMI F64 - Test Method for Determining Pressure Effects on Indicated and Actual Flow for Mass Flow Controllers

Member Price: $148.00
Non-Member Price: $193.00

F03000 - SEMI F30 - Test Method for Verification of Purifier Performance Testing for Trace Gas Impurities and Particles at an Installation Site

SEMI F30 - Test Method for Verification of Purifier Performance Testing for Trace Gas Impurities and Particles at an Installation Site

Member Price: $148.00
Non-Member Price: $193.00

F11300 - SEMI F113 - Test Method for Pressure Transducers Used in Gas Delivery Systems

SEMI F113 - Test Method for Pressure Transducers Used in Gas Delivery Systems

Member Price: $148.00
Non-Member Price: $193.00

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