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M06700 - SEMI M67 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Thickness Data Array Using the ESFQR, ESFQD, and ESBIR Metrics
SEMI M67 - Test Method for Determining Wafer Near-Edge Geometry from a Measured Thickness Data Array Using the ESFQR, ESFQD, and ESBIR Metrics Sale priceMember Price: $148.00
Non-Member Price: $193.00
M06200 - SEMI M62 - Specification for Silicon Epitaxial Wafers
SEMI M62 - Specification for Silicon Epitaxial Wafers Sale price Member Price : $148.00
M05300 - SEMI M53 - Practice for Calibrating Scanning Surface Inspection Systems Using Certified Depositions of Monodispere Reference Spheres on Unpatterned Semiconductor Wafer Surfaces
SEMI M53 - Practice for Calibrating Scanning Surface Inspection Systems Using Certified Depositions of Monodispere Reference Spheres on Unpatterned Semiconductor Wafer Surfaces Sale priceMember Price: $148.00
Non-Member Price: $193.00
M02300 - SEMI M23 - Specification for Polished Monocrystalline Indium Phosphide Wafers
SEMI M23 - Specification for Polished Monocrystalline Indium Phosphide Wafers Sale priceMember Price: $148.00
Non-Member Price: $193.00
G08700 - SEMI G87 - Specification for Plastic Tape Frame for 300 mm Wafer
SEMI G87 - Specification for Plastic Tape Frame for 300 mm Wafer Sale priceMember Price: $148.00
Non-Member Price: $193.00
F04900 - SEMI F49 - Guide for Semiconductor Factory Systems Voltage Sag Immunity
SEMI F49 - Guide for Semiconductor Factory Systems Voltage Sag Immunity Sale priceMember Price: $148.00
Non-Member Price: $193.00
E07000 - SEMI E70 - Guide for Tool Accommodation Process
SEMI E70 - Guide for Tool Accommodation Process Sale priceMember Price: $148.00
Non-Member Price: $193.00
E01700 - SEMI E17 - Guide for Mass Flow Controller Transient Characteristics Tests
SEMI E17 - Guide for Mass Flow Controller Transient Characteristics Tests Sale priceMember Price: $148.00
Non-Member Price: $193.00
D06100 - SEMI D61 - Test Method of Perceptual Angle for OLED Displays
SEMI D61 - Test Method of Perceptual Angle for OLED Displays Sale priceMember Price: $148.00
Non-Member Price: $193.00
C08700 - SEMI C87 - Test Method for Determining Roughness of Polymer Surfaces Used in Ultrapure Water and Liquid Chemical Distribution Systems by Contact Profilometry
SEMI C87 - Test Method for Determining Roughness of Polymer Surfaces Used in Ultrapure Water and Liquid Chemical Distribution Systems by Contact Profilometry Sale priceMember Price: $148.00
Non-Member Price: $193.00
C07700 - SEMI C77 - Test Method for Determining the Counting Efficiency of Liquid-Borne Particle Counters for Which the Minimum Detectable Particle Size is Between 30 nm and 100 nm
SEMI C77 - Test Method for Determining the Counting Efficiency of Liquid-Borne Particle Counters for Which the Minimum Detectable Particle Size is Between 30 nm and 100 nm Sale priceMember Price: $148.00
Non-Member Price: $193.00
C05800 - SEMI C58 - Specification for Hydrogen
SEMI C58 - Specification for Hydrogen Sale priceMember Price: $148.00
Non-Member Price: $193.00
C05600 - SEMI C56 - Specification for Dichlorosilane (SiH2Cl2)
SEMI C56 - Specification for Dichlorosilane (SiH2Cl2) Sale priceMember Price: $148.00
Non-Member Price: $193.00
C01000 - SEMI C10 - MDL（定量下限値）決定に関するガイド
SEMI C10 - MDL（定量下限値）決定に関するガイド Sale priceMember Price: $344.00
Non-Member Price: $457.00
3D01700 - SEMI 3D17 - Specification for Reference Material for Bonded Wafer Stack Void Metrology
SEMI 3D17 - Specification for Reference Material for Bonded Wafer Stack Void Metrology Sale priceMember Price: $148.00
Non-Member Price: $193.00
3D01200 - SEMI 3D12 - Guide for Measuring Flatness and Shape of Low Stiffness Wafers
SEMI 3D12 - Guide for Measuring Flatness and Shape of Low Stiffness Wafers Sale priceMember Price: $148.00
Non-Member Price: $193.00
FH00500 - SEMI FH5 - Guide for Reliability of Flexible Hybrid Electronics
SEMI FH5 - Guide for Reliability of Flexible Hybrid Electronics Sale priceMember Price: $148.00
Non-Member Price: $193.00
T02600 - SEMI T26 - Specification for Electronic Supply Chain Traceability Using Distributed Ledger Technology
SEMI T26 - Specification for Electronic Supply Chain Traceability Using Distributed Ledger Technology Sale priceMember Price: $148.00
Non-Member Price: $193.00
E19400 - SEMI E194 - Guide to Using a Liquid Particle Counter to Assess Particulate Surface Contamination on Critical Chamber Components and Coupons
SEMI E194 - Guide to Using a Liquid Particle Counter to Assess Particulate Surface Contamination on Critical Chamber Components and Coupons Sale priceMember Price: $148.00
Non-Member Price: $193.00
MS01500 - SEMI MS15 - Guide to MEMS Manufacturing Readiness Levels
SEMI MS15 - Guide to MEMS Manufacturing Readiness Levels Sale priceMember Price: $148.00
Non-Member Price: $193.00
T02500 - SEMI T25 - Specification for Blockchain for Semiconductor Supply Chain Traceability
SEMI T25 - Specification for Blockchain for Semiconductor Supply Chain Traceability Sale priceFrom $193.00 USD
C10500 - SEMI C105 - Guide for Trace Iron Analysis in High Purity 2-Propanol (IPA)
SEMI C105 - Guide for Trace Iron Analysis in High Purity 2-Propanol (IPA) Sale priceMember Price: $148.00
Non-Member Price: $193.00
F12000 - SEMI F120 - Test Method for the Electrochemical Critical Pitting Voltage Testing of Stainless Steel Used in Corrosive Gas Systems
SEMI F120 - Test Method for the Electrochemical Critical Pitting Voltage Testing of Stainless Steel Used in Corrosive Gas Systems Sale priceMember Price: $148.00
Non-Member Price: $193.00
3D02200 - SEMI 3D23 - Specification for Glass Carrier Characteristics for Panel Level Packaging (PLP) Applications
SEMI 3D23 - Specification for Glass Carrier Characteristics for Panel Level Packaging (PLP) Applications Sale priceMember Price: $148.00
Non-Member Price: $193.00
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