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F02800 - SEMI F28 - Test Method for Measuring Particle Generation from Process PanelsF02800 - SEMI F28 - Test Method for Measuring Particle Generation from Process Panels
SEMI F28 - Test Method for Measuring Particle Generation from Process Panels Sale priceMember Price: $148.00
Non-Member Price: $193.00
F06700 - SEMI F67 - Test Method for Determining Inert Gas Purifier Capacity
SEMI F67 - Test Method for Determining Inert Gas Purifier Capacity Sale priceMember Price: $148.00
Non-Member Price: $193.00
F05300 - SEMI F53 - Test Method for Evaluating the Electromagnetic Susceptibility of Thermal Mass Flow Controllers
SEMI F53 - Test Method for Evaluating the Electromagnetic Susceptibility of Thermal Mass Flow Controllers Sale priceMember Price: $148.00
Non-Member Price: $193.00
E05400 - SEMI E54 - Specification for Sensor/Actuator Network
SEMI E54 - Specification for Sensor/Actuator Network Sale priceMember Price: $148.00
Non-Member Price: $193.00
E03001 - SEMI E30.1 - Specification for Inspection and Review Specific Equipment Model (ISEM)
SEMI E30.1 - Specification for Inspection and Review Specific Equipment Model (ISEM) Sale priceMember Price: $148.00
Non-Member Price: $193.00
E17300 - SEMI E173 - Specification for XML SECS-II Message Notation (SMN)
SEMI E173 - Specification for XML SECS-II Message Notation (SMN) Sale priceMember Price: $148.00
Non-Member Price: $193.00
E11300 - SEMI E113 - Specification for Semiconductor Processing Equipment RF Power Delivery Systems
SEMI E113 - Specification for Semiconductor Processing Equipment RF Power Delivery Systems Sale priceMember Price: $148.00
Non-Member Price: $193.00
D07500 - SEMI D75 - Test Method for Color Reproduction and Perceptual Contrast of Display
SEMI D75 - Test Method for Color Reproduction and Perceptual Contrast of Display Sale priceMember Price: $148.00
Non-Member Price: $193.00
D00600 - SEMI D6 - Specification for Flat Panel Display (FPD) Mask Substrates
SEMI D6 - Specification for Flat Panel Display (FPD) Mask Substrates Sale priceMember Price: $148.00
Non-Member Price: $193.00
C00334 - SEMI C3.34 - Specification for Disilane (Si2H6) in Cylinders, 97% Quality
SEMI C3.34 - Specification for Disilane (Si2H6) in Cylinders, 97% Quality Sale priceMember Price: $148.00
Non-Member Price: $193.00
C00320 - SEMI C3.20 - Specification for Helium (He), in Cylinders, 99.9995%
SEMI C3.20 - Specification for Helium (He), in Cylinders, 99.9995% Sale priceMember Price: $148.00
Non-Member Price: $193.00
3D01300 - SEMI 3D13 - Guide for Measuring Voids in Bonded Wafer Stacks
SEMI 3D13 - Guide for Measuring Voids in Bonded Wafer Stacks Sale priceMember Price: $148.00
Non-Member Price: $193.00
3D00500 - SEMI 3D5 - Guide for Metrology Techniques to be Used in Measurement of Geometrical Parameters of Through-Silicon Vias (TSVs) in 3DS-IC Structures
SEMI 3D5 - Guide for Metrology Techniques to be Used in Measurement of Geometrical Parameters of Through-Silicon Vias (TSVs) in 3DS-IC Structures Sale priceMember Price: $148.00
Non-Member Price: $193.00
E19900 - SEMI E199 - Specification for 300 mm Film Frame FOUP (FFF) Load Port
SEMI E199 - Specification for 300 mm Film Frame FOUP (FFF) Load Port Sale priceMember Price: $148.00
Non-Member Price: $193.00
M09400 - SEMI M94 - Specification for Silicon Carbide Engineered Substrates
SEMI M94 - Specification for Silicon Carbide Engineered Substrates Sale priceMember Price: $148.00
Non-Member Price: $193.00
E19200 - SEMI E192 - Guide for Equipment Adoption Criteria for GEM and GEM-related Standards
SEMI E192 - Guide for Equipment Adoption Criteria for GEM and GEM-related Standards Sale priceMember Price: $148.00
Non-Member Price: $193.00
E19001 - SEMI E190.1 - Specification for Common Data for Etch Components
SEMI E190.1 - Specification for Common Data for Etch Components Sale priceMember Price: $148.00
Non-Member Price: $193.00
E18900 - SEMI E189 - Specification for Equipment Management of Consumables and Durables (EMCD)
SEMI E189 - Specification for Equipment Management of Consumables and Durables (EMCD) Sale priceMember Price: $148.00
Non-Member Price: $193.00
T02400 - SEMI T24 - Specification for ID Marking for Glass Carrier Characteristics of Panel Level Packaging (PLP) Applications
SEMI T24 - Specification for ID Marking for Glass Carrier Characteristics of Panel Level Packaging (PLP) Applications Sale priceMember Price: $148.00
Non-Member Price: $193.00
E18600 - SEMI E186 - Specification for Location and Dimensions for Power Connectors and Ethercat Ports in Mass Flow Controllers and Mass Flow Meters
SEMI E186 - Specification for Location and Dimensions for Power Connectors and Ethercat Ports in Mass Flow Controllers and Mass Flow Meters Sale priceMember Price: $148.00
Non-Member Price: $193.00
MS01300 - SEMI MS13 - Guide for Use of Test Patterns for Characterizing a Deep Reactive Ion Etching (DRIE) Process
SEMI MS13 - Guide for Use of Test Patterns for Characterizing a Deep Reactive Ion Etching (DRIE) Process Sale priceMember Price: $148.00
Non-Member Price: $193.00
C10000 - SEMI C100 - Guide for Reporting Chemical Mechanical Planarization (CMP) Polishing Pads Hardness Used in Semiconductor Manufacturing
SEMI C100 - Guide for Reporting Chemical Mechanical Planarization (CMP) Polishing Pads Hardness Used in Semiconductor Manufacturing Sale priceMember Price: $148.00
Non-Member Price: $193.00
S00600 - SEMI S6 - 半導体製造装置の排気換気に関する環境，健康，安全のためのガイドライン
SEMI S6 - 半導体製造装置の排気換気に関する環境，健康，安全のためのガイドライン Sale priceMember Price: $344.00
Non-Member Price: $457.00
3D02100 - SEMI 3D21 - Guide for Describing Glass-Based Material for Use in 3DS-IC Process
SEMI 3D21 - Guide for Describing Glass-Based Material for Use in 3DS-IC Process Sale priceMember Price: $148.00
Non-Member Price: $193.00
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